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On-chip Peltier cooling using current pulse

机译:使用电流脉冲进行片上珀耳帖冷却

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摘要

Thermoelectric coolers (TECs) can address an efficient removal of localized heat for a wide range of applications such as microelectronic processors, DNA micro arrays, lasers. The efficient usage of thermoelectric devices for these applications require investigation and remedy of various obstacles such as integration of these devices with electronic package, parasitic contact resistances and utilization of appropriate current pulses and control algorithms. We investigate the effect of steady state and transient mode of operation of ultrathin TEC devices on hot spot temperature reduction on a chip through a developed computational model. The numerical model incorporates the effect of thermal and electrical contact resistances to analyze the hot spot cooling. Our analysis shows that transient pulses can be very effective to reduce the hotspot temperature in addition to the cooling achieved by the steady state current through the device. Thermal and electrical contact resistance play a very crucial role in the performance of TEC devices as high values of these resistances can completely diminish the effect of Peltier cooling. The effect of these parasitic resistances is even higher for the transient cooling of hot-spots by the pulsed current through the device compared to the steady state operation.
机译:热电冷却器(TEC)可以解决局部热量的有效去除问题,适用于各种应用,例如微电子处理器,DNA微阵列,激光器。为了将热电设备有效地用于这些应用,需要对各种障碍进行调查和补救,例如将这些设备与电子封装集成,寄生接触电阻以及利用适当的电流脉冲和控制算法。我们通过开发的计算模型研究了超薄TEC器件的稳态和瞬态操作模式对芯片上热点温度降低的影响。数值模型结合了热和电接触电阻的影响,以分析热点冷却。我们的分析表明,除了通过稳态电流通过器件实现的冷却之外,瞬态脉冲还可以非常有效地降低热点温度。热接触电阻和电接触电阻在TEC器件的性能中起着至关重要的作用,因为这些电阻的高值可以完全消除Peltier冷却的影响。与稳态操作相比,这些寄生电阻对通过器件的脉冲电流对热点进行瞬态冷却的影响甚至更高。

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