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Verification of ball-on-ring test using finite element analysis

机译:使用有限元分析验证环上球试验

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The ball-on-ring (BOR) test is an effective technique used to characterize the biaxial fracture strength of brittle materials. In particular, damages induced by wafer backgrinding process can be evaluated using the BOR test. It is difficult to measure directly the radius of contact area between the loading ball and a specimen, which is needed for stress determination by an analytic solution. In this study, parametric finite element analyses were performed to compare with known closed-form solutions. It was found that the effect of small loading area must not be ignored and that the radius of contact could be precisely determined using Hertz's contact theory. This can serve as a guideline to accurately obtain the fracture strength of a BOR specimen.
机译:环上球(BOR)测试是一种用于表征脆性材料双轴断裂强度的有效技术。尤其是,可以使用BOR测试评估由晶片回磨工艺引起的损坏。直接测量加载球与样本之间的接触区域的半径是困难的,这是通过解析解决方案确定应力所必需的。在这项研究中,进行了参数有限元分析以与已知的封闭形式解决方案进行比较。已经发现,小负载区域的影响不容忽视,接触半径可以使用赫兹的接触理论精确确定。这可以作为准确获得BOR试样断裂强度的指导。

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