首页> 外文会议>2008 MRS spring meeting symposium proceedings >Nanoscale Characterization of Metal/Semiconductor Nanocables
【24h】

Nanoscale Characterization of Metal/Semiconductor Nanocables

机译:金属/半导体纳米电缆的纳米级表征

获取原文
获取原文并翻译 | 示例

摘要

Comprehensive characterization at nanoscale is needed to create novel nanostructures for high efficiency solar cells. To produce consistent results, wide-ranging characterization procedures for integrated nanostructures have been developed. Characterization of a novel nanowire, nanotube and nanocable system includes: chemical, electrochemical, structural, optical and electrical characterization of nanostructures in relation with growth conditions. We present here results on Au and CdTe/Au system that help understanding how surface composition and properties are modified in this system. New challenges in structural characterization were also identified and improved sample preparation techniques were developed.
机译:需要纳米级的全面表征来创建用于高效太阳能电池的新型纳米结构。为了产生一致的结果,已经开发了用于集成纳米结构的广泛表征程序。新型纳米线,纳米管和纳米电缆系统的表征包括:与生长条件有关的纳米结构的化学,电化学,结构,光学和电学表征。我们在此介绍Au和CdTe / Au系统的结果,这些结果有助于了解如何在此系统中修改表面成分和性能。还确定了结构表征方面的新挑战,并开发了改进的样品制备技术。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号