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ISOTHERMAL SHEAR FATIGUE LIFE OF Sn-xAg-0.5Cu FLIP CHIP INTERCONNECTS

机译:Sn-xAg-0.5Cu弹片互连件的等温剪切疲劳寿命

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摘要

The mechanical shear fatigue test has been performed to look for the effect of silver content on the fatigue properties of Sn-xAg-0.5Cu (x=l, 2, 3 and 4) flip chip interconnections. As the strength of the solder alloy increases with increasing silver content, the increase in silver content results in preventing a shear plastic deformation of solder bump. Therefore, the flip chip joints made using higher silver content solder such as 3 and 4Ag exhibit longer fatigue life, if the same levels of displacement is applied. The fatigue ductility of the solder decreases with increasing the silver content. Therefore, the fatigue endurance of the 1Ag solder itself is superior to other solders in high plastic strain regime, even though the strength of the solder is the lowest in the solders tested. Based on this study, the 3Ag solder might exhibit good fatigue performance for all condition, and the lAg solder is optimum for severe strain condition.
机译:已经进行了机械剪切疲劳试验,以寻找银含量对Sn-xAg-0.5Cu(x = 1、2、3和4)倒装芯片互连的疲劳性能的影响。随着焊料合金的强度随着银含量的增加而增加,银含量的增加导致防止焊料凸块的剪切塑性变形。因此,如果施加相同的位移水平,则使用含银量较高的焊料(例如3和4Ag)制成的倒装芯片接头具有更长的疲劳寿命。焊料的疲劳延展性随着银含量的增加而降低。因此,即使在测试的焊料中焊料的强度最低,在高塑性应变条件下1Ag焊料本身的耐疲劳性也优于其他焊料。根据这项研究,3Ag焊料在所有条件下都可能表现出良好的疲劳性能,而lAg焊料最适合于严重的应变条件。

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