Faculty of Engineering, Environment and Computing, Coventry University, Coventry, UK;
Faculty of Engineering, Environment and Computing, Coventry University, Coventry, UK;
Faculty of Engineering, Environment and Computing, Coventry University, Coventry, UK;
Faculty of Engineering, Environment and Computing, Coventry University, Coventry, UK;
Silicon; Gallium nitride; Temperature measurement; Performance evaluation; Temperature; Junctions; HEMTs;
机译:Al预剂量和AIN成核的温度效应影响基于GaN-on-Si的高压器件的缓冲层性能
机译:对基于GAN-ON-SI的高压装置的缓冲层性能的α预测和AIN成核的温度效应
机译:通过加速功率循环测试分析商用650 V离散型GaN-on-Si HEMT电源器件的断态漏源漏电流故障机理
机译:升高温度下商业GAN-on-SI器件的静态性能
机译:GaN-on-Si功率器件的性能增强和表征技术。
机译:勘误:在与硅纳米和微电子器件兼容的温度下高性能锆钛酸铅钛酸盐的活性层
机译:损伤阻滞装置在递增纤维聚氨酯泡沫复合夹芯板中延迟紧固件 - 空穴相互作用失效夹层在提高温度下进行静态和动态载荷的影响
机译:n Gaas-阳极氧化物mIs器件在高温下的反转和积累层形成。