首页> 外文会议>1997 International Symposium on Electromagnetic Compatibility 1997, Beijing, China >Effective Testing of Computerized Equipment for EMC Immunity to Fast Electrical Transients
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Effective Testing of Computerized Equipment for EMC Immunity to Fast Electrical Transients

机译:有效测试计算机设备对快速电瞬变的EMC抵抗力

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One of the major problems in testig comput-erized equipment for immunity to electrical transients is their time-variant susceptibility. Since complete immunity testing of an operational cycle with hundreds of susceptible time windows is prohibitive this paper aims at provid-ing methods for affordable estimation of mean and maximum malfunction probability in an operational cycle. For the latter reinforcement learning algorithms are used which automatically restict testing to most susceptible time windows. This allows affordable testing also for safety-related equipment and supports effective redesign.
机译:Testig计算机设备抗瞬变电抗的主要问题之一是其时变敏感性。由于对具有数百个敏感时间窗口的操作周期进行完整的抗扰度测试是令人望而却步的,因此本文旨在提供一种方法,以合理的方式估算操作周期中的平均和最大故障概率。对于后者,使用了增强学习算法,该算法可自动限制测试到最敏感的时间窗口。这样还可以对与安全相关的设备进行价格合理的测试,并支持有效的重新设计。

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