首页> 外文会议>12th Annual Pan Pacific Microelectronics Symposium amp; Tabletop Exhibition: International Technical Interchange >LEAD-FREE SOLDER DURABILITYTESTING AT ACCELERATED THERMAL EXCURSIONS FOR QFN AND DFN PACKAGE INTERCONNECTS
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LEAD-FREE SOLDER DURABILITYTESTING AT ACCELERATED THERMAL EXCURSIONS FOR QFN AND DFN PACKAGE INTERCONNECTS

机译:QFN和DFN封装互连的加速热偏移时的无铅焊料耐久性测试

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摘要

Hamilton Sundstrand’s (HS) subsidiary in Nordlingen, Germany is using a synchronous step down switching regulator from Linear Technology in a low voltage power supply (LVPS) application. This device is packaged in a 32 pin Quad Flat No-lead (QFN32) package. During thermal cycling tests there have been numerous instances of solder joint failures associated with this device. An evaluation of the PWB layout for this device and the solder stencil design has revealed deviations from the design features recommended by QFN32 manufacturers. Further, failure data shows that the use of conformal coating accelerates the failure mechanism.
机译:汉密尔顿·森德斯特朗(Hamilton Sundstrand)在德国诺德林根(HS)的子公司正在将凌力尔特公司(Linear Technology)的同步降压开关稳压器用于低压电源(LVPS)应用。该器件采用32引脚四方扁平无引线(QFN32)封装。在热循环测试过程中,有许多与该设备相关的焊点故障实例。对该器件的PWB布局和焊料模板设计进行的评估显示,与QFN32制造商建议的设计功能有所不同。此外,失效数据表明,使用保形涂层可加速失效机理。

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