In ATE world, testability, reliability and profitability are three very important things. To achieve these, several keys must be highly respected. This paper talks about one of those keys-TDR. which is a tool for us to compensate the propagation time for signals to travel from PE within a tester to all DUT on the DIB. This paper first demonstrates the propagation of a signal in time domain, then simulates the reflections at an impedance mismatching point, followed by TDR principles and methodology, and finally gives some advices on DIB designs in favor of TDR.
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