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CONTROL PROGRAM, CONTAINER, AND SEMICONDUCTOR DEVICE MANUFACTURING FACILITY FOR CHARGING OF WAFER TYPE SENSOR AND AUTO TEACHING

机译:控制程序、容器和半导体设备制造厂的充电圆片型传感器和汽车教学

摘要

To provide a control device for charging and auto teaching of a wafer type sensor, a control program executed by the control device, a wafer type sensor storage device, a wafer type sensor charging device, and a semiconductor device manufacturing facility.SOLUTION: In an auto teaching system 100 including a substrate processing apparatus 110 for processing wafers, a wafer type sensor 120 to inspect a semiconductor device manufacturing facility and its part, a control device 130, a storage device 140 for storing the wafer type sensor 120, and a charging device 150 for charging the wafer type sensor 120, a control program executed by the control device 130 equipped with a processor monitors the semiconductor device manufacturing facility and its part using the wafer type sensor 120 and monitors the remaining battery level of the wafer type sensor.SELECTED DRAWING: Figure 1
机译:

著录项

  • 公开/公告号JP2022091722A

    专利类型

  • 公开/公告日2022-06-21

    原文格式PDF

  • 申请/专利权人 SEMES CO. LTD.;

    申请/专利号JP20210198285

  • 发明设计人 JANG YONG SEOK;PARK IN KYU;

    申请日2021-12-07

  • 分类号H01L21/02;

  • 国家

  • 入库时间 2023-06-25 23:46:10

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