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Method and system for analyzing spatial resolution of microwave near-field probe and microwave microscope equipped with the system
Method and system for analyzing spatial resolution of microwave near-field probe and microwave microscope equipped with the system
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机译:用于分析微波近场探针和配备该系统的微波显微镜的空间分辨率的方法和系统
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摘要
The present disclosure relates to the technical field of microwave test, and discloses a method and a system for analyzing the spatial resolution of a microwave near-field probe and a microwave microscope equipped with the system, wherein in the method for analyzing the spatial resolution of the microwave near-field probe, a three-dimensional equipotential surface in a sample is drawn by using an electric field formula calculated by a quasi-static theory; an equivalent model of a probe sample is established by using finite element analysis software, so as to change material characteristics in the area outside the three-dimensional equipotential surface; by observing the influence of changing materials on the potential distribution in the sample, a near-field action range of the probe is determined, and the spatial resolution of the microwave near-field scanning microscope is analyzed and calculated.
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