首页> 外国专利> Method with improved focus setting considering an image level tilt in a plurality particle beam microscope

Method with improved focus setting considering an image level tilt in a plurality particle beam microscope

机译:在多粒子束显微镜中考虑图像水平倾斜的改进聚焦设置方法

摘要

The invention relates to a plurality of particle beam microscopes and an associated method for adjusting an optimal focus plane with optimal resolution and adjusting a telecentric irradiation with the plurality of primary beams. A method is proposed for determining an optimal adjustment plane into which an object surface is brought. Measures are also proposed:which enable improved resolution and telecentric irradiation for a large number of primary beams. The means include a targeted selection and a targeted individual influence of individual primary beams and/or means to influence the plurality of primary beams in a collective manner.
机译:本发明涉及多个粒子束显微镜以及用于调整具有最佳分辨率的最佳聚焦平面和调整具有多个主光束的远心辐照的相关方法。提出了一种确定物体表面进入的最佳平差平面的方法。还提出了一些措施:这些措施能够提高分辨率,并对大量的原束进行远心辐照。所述装置包括单个主波束的目标选择和目标个体影响和/或以集体方式影响多个主波束的装置。

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