首页> 外国专利> METHOD FOR DETERMINING TYPE OF PALATAL VAULT FOR TACTICS OF ORTHODONTIC TREATMENT DURING OCCLUSION OF PERMANENT TEETH

METHOD FOR DETERMINING TYPE OF PALATAL VAULT FOR TACTICS OF ORTHODONTIC TREATMENT DURING OCCLUSION OF PERMANENT TEETH

机译:恒牙咬合正畸治疗策略中腭弓类型的确定方法

摘要

FIELD: medicine.;SUBSTANCE: invention relates to medicine, namely to dentistry, and can be used to determine the shape of the palatine fornix by individual morphometric parameters of dentoalveolar arches. Palatal arch width is measured between the points located in the interdental spaces between the second premolars and the first molars, followed by measuring the height and width of the palatal arch on plaster models of jaws or on frontal sections of cone-beam computed tomograms (CBCT). Palatinal index (PI) is determined. Width of the palatine vault is measured between points located in the interdental spaces between the second premolars and the first molars (K2). Then the distance of the height of the palatine vault (K1) is measured, which corresponds to the length of the perpendicular from the line K2 to the deepest point of the palate. If the percentage ratio of distances K1 to K2 is 36 % to 44 %, the type of palatine vault is considered to be mesopalatinal, more than 44 % - as dolichopalatinal, and less than 36 % - as brachypalatinal types.;EFFECT: method provides more effective and reliable diagnosis of dentoalveolar anomalies and planning of orthodontic treatment of patients in the period of permanent dentition due to objectification of determining the shape of the dental arch, based on measurement of the main morphometric parameters of the palatine arch.;1 cl, 1 dwg, 4 ex
机译:领域:医学。;实质:本发明涉及医学,即牙科学,可用于通过齿槽弓的单个形态测量参数来确定腭穹隆的形状。腭弓宽度在位于第二前磨牙和第一磨牙之间的齿间间隙中的点之间测量,然后在颌骨石膏模型或锥形束计算机断层扫描(CBCT)的前部测量腭弓的高度和宽度。测定腭指数(PI)。腭穹窿的宽度是在第二前磨牙和第一磨牙(K2)之间牙间隙的点之间测量的。然后测量腭穹顶高度(K1)的距离,该距离对应于从线K2到腭最深点的垂线长度。如果距离K1到K2的百分比比率为36%到44%,腭穹窿的类型被认为是中腭型,超过44%被认为是腭腭腭型,低于36%被认为是近腭型。;效果:该方法通过测量腭弓的主要形态参数,客观化地确定牙弓的形状,从而为恒牙期患者提供更有效、更可靠的齿槽异常诊断和正畸治疗计划。;1个cl,1个图纸,4个ex

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