首页> 外国专利> FACTORY MANUFACTURING FACILITY SYSTEM MONITORING APPARATUS FOR MONITORING THE DEFECTIVE RATE FOR THE MANUFACTURING PROCESS

FACTORY MANUFACTURING FACILITY SYSTEM MONITORING APPARATUS FOR MONITORING THE DEFECTIVE RATE FOR THE MANUFACTURING PROCESS

机译:用于监测制造过程的缺陷率的工厂制造设施系统监控装置

摘要

Disclosed is a system monitoring device for a factory production facility capable of monitoring a defect rate for a production process. The present invention generates a predictive model that predicts whether the final reject rate value for a production process will exceed a threshold reject rate value based on a pre-specified training set, and then, based on the predictive model, the manager Factory production facility that predicts whether or not the final reject rate value for the production process will exceed the critical reject rate value and displays the result on the screen according to the process-specific defect rate value for each of some detailed processes applied as input from By presenting the system monitoring device, the manager can more effectively monitor the defect rate for the production process.
机译:公开了一种用于工厂生产设备的系统监测装置,其能够监测生产过程的缺陷率。 本发明生成了一种预测模型,其预测生产过程的最终抑制率值是基于预先指定的训练集的阈值抑制率值,然后,基于预测模型,经理工厂生产设施 预测生产过程的最终抑制率值是否超过关键抑制率值,并根据应用系统的一些详细过程中的每个详细过程中的每个详细进程中的每个详细过程显示结果的结果 监控设备,经理可以更有效地监控生产过程的缺陷率。

著录项

  • 公开/公告号KR102348006B1

    专利类型

  • 公开/公告日2022-01-07

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR1020200125517

  • 发明设计人 홍성웅;진정창;

    申请日2020-09-28

  • 分类号G05B23/02;G05B19/418;G06N3/08;

  • 国家 KR

  • 入库时间 2022-08-24 23:26:18

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