首页> 外国专利> Surface measuring apparatus, wire manufacturing apparatus, surface measuring method, and method of manufacturing wire

Surface measuring apparatus, wire manufacturing apparatus, surface measuring method, and method of manufacturing wire

机译:表面测量装置,电线制造设备,表面测量方法和制造丝的方法

摘要

Problem to be solved: to provide a technique for improving the sensitivity of the detection sensitivity of the film abnormality with respect to the surface measurement for detecting the film abnormality using the contact member.The surface measuring apparatus comprises a contact member, a surface displacement meter, a noise detecting portion for detecting roll noise which is periodic noise in the displacement amount of the contact member, and a noise reducing portion.The contact member is in contact with the surface of the film of the conductor moving in the predetermined direction of conveyance, and is displaced in accordance with the shape of the surface of the film.The surface displacement meter measures the displacement of the contact member in accordance with the shape of the surface of the film.The noise detector detects the roll noise which is periodic noise in the displacement of the contact member.The noise reduction part reduces the component of the roll noise detected by the noise detecting portion from the amount of displacement of the contact member measured by the surface displacement meter.Diagram
机译:要解决的问题:提供一种通过接触构件来改善膜异常的检测灵敏度的灵敏度的技术。表面测量装置包括接触构件,表面位移仪表,用于检测滚动噪声的噪声检测部分,该噪声噪声是接触构件的位移量的周期性噪声,以及降噪部分。接触构件与导体膜的表面接触,导体在预定的输送方向上移动,并且根据胶片表面的形状移位。表面位移计根据胶片表面的形状测量接触构件的位移。噪声检测器检测到周期性噪声的滚动噪声在接触构件的位移中。降噪部分减少了所检测到的卷噪声的组件噪声检测部分由表面位移测量测量的接触构件的位移量.Diagram

著录项

  • 公开/公告号JP2022001827A

    专利类型

  • 公开/公告日2022-01-06

    原文格式PDF

  • 申请/专利权人 日立金属株式会社;

    申请/专利号JP20200106250

  • 发明设计人 大築 優;佐藤 巧;

    申请日2020-06-19

  • 分类号G01B5/06;H01B13;

  • 国家 JP

  • 入库时间 2022-08-24 23:16:09

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号