首页> 外国专利> Temperature abnormality detecting system, temperature abnormality detecting method and program

Temperature abnormality detecting system, temperature abnormality detecting method and program

机译:温度异常检测系统,温度异常检测方法和程序

摘要

To provide a temperature abnormality detection system that facilitates setting of a threshold of a target apparatus and can detect abnormality in the target apparatus in an early stage.SOLUTION: The temperature abnormality detection system comprises: a temperature measuring unit that measures a current temperature Tof a target apparatus 91 moment by moment; a maximum value detecting unit 141 that detects the maximum value ΔTof a temperature change rate ΔTbased on the measured temperature; a decay time calculating unit that calculates a decay time th from when the maximum value ΔTof the temperature change rate is detected until when the temperature change rate is reduced to a predetermined decay ratio with respect to the maximum value ΔT; a predicted temperature calculation unit 142 that calculates a predicted reaching temperature Tof the target apparatus 91 based on the decay time of the temperature change rate; and an abnormality determination unit 143 that determines that the target apparatus is abnormal when the calculated reaching temperature exceeds a predetermined temperature threshold Th.SELECTED DRAWING: Figure 3
机译:为了提供一种促进目标装置的阈值的温度异常检测系统,并且可以在早期阶段中检测目标装置中的异常。概率:温度异常检测系统包括:测量当前温度TOF A的温度测量单元目标装置91时刻;最大值检测单元141,其检测在测量温度上的温度变化率ΔT的最大值ΔT;衰减时间计算单元,计算衰减时间Th从检测到温度变化率的最大值ΔTΔTof,直到相对于最大值ΔT降低到预定的衰减比。一种预测的温度计算单元142,基于温度变化率的衰减时间计算目标装置91的预测到达温度TOF;当计算的达到温度超过预定温度阈值TH时,确定目标装置异常的异常确定单元143。选择图:图3

著录项

  • 公开/公告号JP6988765B2

    专利类型

  • 公开/公告日2022-01-05

    原文格式PDF

  • 申请/专利权人 オムロン株式会社;

    申请/专利号JP20180205488

  • 发明设计人 池内 涼;山田 隆章;小園 健晃;

    申请日2018-10-31

  • 分类号G01K3/10;G01K7/42;

  • 国家 JP

  • 入库时间 2022-08-24 23:12:34

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号