System and Method for 3D Shape Measurement of Freeform Surface Based on High-Speed Deflectometry using Composite Patterns

摘要

The present disclosure is related to a system and a method for 3D shape measurement of a freeform surface based on high-speed deflectometry using composite patterns. More particularly, a system for profile measurement based on high-speed deflectometry using composite patterns includes: a composite pattern generation part to project a composite pattern generated by synthesizing patterns having different frequencies to a measurement object; a detector to acquire images of a deformed composite pattern reflected from the measurement object; and a phase acquisition part to acquire wrapped phases by each frequency from the composite pattern and unwrapped phases from the respective wrapped phases.