3 Apparatus and method for 3D measurement of freeform surfaces based on high-speed deflectometry using composite patterns

摘要

The present invention relates to a shape measurement system and a measurement method using an ultra-high speed deflection measurement method using a complex pattern. More specifically, the present invention relates to the shape measurement system using the ultra-high speed deflection measurement method using the complex pattern comprising: a complex pattern generating part for projecting a complex pattern obtained by synthesizing a pattern having different frequency from each other to a measurement object; a detector for acquiring an image of a modified complex pattern reflected from the measurement object; a phase acquiring part for acquiring a wrapped phase for each frequency from the complex pattern and acquiring an unwrapped phase from each wrapped phase; and an analysis means for measuring and analyzing a 3D shape of the measurement object from the acquired phase.