首页> 外国专利> METHOD AND DEVICE FOR AUTOMATICALLY IDENTIFYING A PRODUCT ERROR IN A PRODUCT AND/OR FOR AUTOMATICALLY IDENTIFYING A PRODUCT ERROR CAUSE OF THE PRODUCT ERROR

METHOD AND DEVICE FOR AUTOMATICALLY IDENTIFYING A PRODUCT ERROR IN A PRODUCT AND/OR FOR AUTOMATICALLY IDENTIFYING A PRODUCT ERROR CAUSE OF THE PRODUCT ERROR

机译:用于自动识别产品中的产品错误的方法和设备和/或自动识别产品错误的产品错误原因

摘要

The invention relates to a method for automatically identifying a product error in a product (1, 2, 3, 40, 41, 42, 43, 44, 45) and/or for automatically identifying a product error cause of the product error, comprising the steps: - producing the product (1, 2, 3, 40, 41, 42, 43, 44, 45, 100) from a multiplicity of product elements (4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18) by way of a multiplicity of manufacturing steps, and - detecting a number n of items of test information by means of at least one product test (101), wherein the n items of test information form an n-dimensional test value. The method according to the invention is characterized by the steps: - carrying out dimension reduction of the n-dimensional test value (102) by means of at least one statistics process to obtain a dimension-reduced test value, - comparing the dimension-reduced test value (103) to a multiplicity of learned reference values (46, 47, 48, 49, 50, 51, 52, 53, 54, 55, 56, 57, 58, 59, 60), - assigning the dimension-reduced test value to at least one group of reference values (46, 47, 48, 49, 50, 51, 52, 53, 54, 55, 56, 57, 58, 59, 60, 104) that are similar to each other, and - automatically identifying the product error (105) and/or the product error cause (106) on the basis of the assignment. The invention further relates to a corresponding device.
机译:本发明涉及一种用于在产品(1,2,3,40,41,42,43,44,40,42,43,44,45)中的产品(1,2,3,40,41,42,43,44,45)和/或用于自动识别产品错误的产品错误原因的方法以下步骤: - 从多种产品元素(4,5,6,7,8,9,10,11,产生产品(1,2,3,40,41,42,43,44,45,100), ,12,13,14,15,16,17,18)通过多个制造步骤,通过至少一个产品测试(101)来检测一系列测试信息N,其中n测试信息项形成n维测试值。根据本发明的方法的特征在于步骤: - 通过至少一个统计过程进行N维测试值(102)的尺寸降低,以获得尺寸降低的测试值, - 比较尺寸减少测试值(103)到多个学习参考值(46,47,48,49,50,51,52,53,54,55,56,57,58,59,60), - 分配尺寸减小测试值到至少一组参考值(46,47,48,49,50,51,52,53,54,55,56,57,58,59,60,104),其彼此类似, - 在分配的基础上自动识别产品错误(105)和/或产品错误原因(106)。本发明还涉及一种相应的装置。

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