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X-ray fluorescence analyzer with a plurality of measurement channels, and a method for performing x-ray fluorescence analysis

机译:具有多个测量通道的X射线荧光分析仪,以及进行X射线荧光分析的方法

摘要

An X-ray fluorescence analyzer including an X-ray tube for emitting incident X-rays in the direction of a first optical axis. A slurry handling unit is configured to maintain a constant distance between a sample of slurry and the X-ray tube. A first crystal diffractor is located in a first direction from the slurry handling unit. The first crystal diffractor includes a first crystal and a first radiation detector configured to detect fluorescent X-rays diffracted by the first crystal at a first energy resolution. A second crystal diffractor is located in a second direction from the slurry handling unit. The second crystal diffractor includes a second crystal and a second radiation detector configured to detect fluorescent X-rays diffracted by the second crystal at a second energy resolution. The first crystal is a pyrolytic graphite crystal, the second crystal is of a material other than pyrolytic graphite, and the first and second crystal diffractors are configured to direct to their respective radiation detectors characteristic fluorescent radiation of a same element.
机译:一种X射线荧光分析仪,包括X射线管,用于在第一光轴方向上发射入射X射线。浆料处理单元被配置为在浆料和X射线管样品之间保持恒定距离。第一晶体衍射器位于从浆料处理单元的第一方向上。第一晶体衍射器包括第一晶体和第一辐射检测器,其配置成以第一能量分辨率检测由第一晶体衍射的荧光X射线。第二晶体衍射器位于浆料处理单元的第二方向上。第二晶体衍射器包括第二晶体和第二辐射检测器,其被配置为以第二能量分辨率检测由第二晶体衍射的荧光X射线。第一晶体是热解石墨晶体,第二晶体是除热解石墨之外的材料,第一和第二晶体衍射器被配置为指导它们各自的辐射检测器特征荧光辐射的相同元件的特征荧光辐射。

著录项

  • 公开/公告号US11199513B2

    专利类型

  • 公开/公告日2021-12-14

    原文格式PDF

  • 申请/专利权人 OUTOTEC (FINLAND) OY;

    申请/专利号US201817049257

  • 发明设计人 TOMMI KOSKINEN;ANTTI PELLI;HEIKKI SIPILÄ;

    申请日2018-04-20

  • 分类号G01N23/223;G21K1/06;

  • 国家 US

  • 入库时间 2024-06-14 22:31:38

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