首页> 外国专利> METHOD FOR DETERMINING AT LEAST ONE CHARACTERISTIC OF A PARTICLE SIZE DISTRIBUTION, AND DEVICE WITH MEASURING EQUIPMENT

METHOD FOR DETERMINING AT LEAST ONE CHARACTERISTIC OF A PARTICLE SIZE DISTRIBUTION, AND DEVICE WITH MEASURING EQUIPMENT

机译:确定粒度分布的至少一个特征的方法,以及测量设备的装置

摘要

The invention relates to a method for determining at least one characteristic of a particle size distribution in a moving particle flow using at least one microwave resonator which provides at least two measurement values for the particles flow, wherein at least one fineness feature and/or quantile of the particle size distribution is determined from the measurement values. The invention also relates to a device for generating a moving particle flow, comprising measuring equipment for determining at least one characteristic of a particle size distribution in the moving particle flow, said equipment having at least one microwave resonator which provides at least two measurement values for the particle flow, wherein the measuring equipment is designed to analyze at least one fineness feature and/or a quantile of the particle size distribution from the at least two measurement values of the microwave resonator.
机译:本发明涉及一种使用至少一个微波谐振器在移动颗粒流中确定粒度分布的至少一个特征的方法,该微波谐振器为粒子流提供至少两个测量值,其中至少一个细度特征和/或分量 从测量值确定粒度分布。 本发明还涉及一种用于产生运动颗粒流的装置,包括测量设备,用于确定运动粒度中的粒度分布的至少一个特征,所述设备具有至少一个微波谐振器,其为至少两个测量值提供至少两个微波谐振器 其中测量设备的颗粒流动设计用于分析至少一个细度分布的粒度分布和/或从微波谐振器的至少两个测量值分布的粒度分布。

著录项

  • 公开/公告号WO2021244768A1

    专利类型

  • 公开/公告日2021-12-09

    原文格式PDF

  • 申请/专利权人 TEWS ELEKTRONIK GMBH & CO. KG;

    申请/专利号WO2020EP74756

  • 发明设计人 SCHLEMM UDO;RICHTER HENDRIK;

    申请日2020-09-04

  • 分类号G01N15/02;G01N22;G01N33/15;

  • 国家 EP

  • 入库时间 2022-08-24 22:45:28

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