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Conference on scanning microscopy

召开年：2010
召开地：Monterey, CA(US)
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1.ELECTRON MICROSCOPY AND CATHODOLUMINESCENCE IN ELECTROSPUN NANODIMENTIONAL STRUCTURES: CHALLENGES AND OPPORTUNITIES

机译：电子双纳米结构中的电子显微镜和阴极发光：挑战和机遇
- 作者：E.M. Campo;A. Melendez;K. Morales;J. Poplawsky;J. J. Santiago-Aviles;I. Ramos
- 会议名称：《Conference on scanning microscopy》 | 2010年
- GaN;
- nanofibers;
- electrospinning;
- ESEM;
- TEM;
- cathodoluminescence;
2.Dielectric Slot Tip for Scanning Near-Field Microwave Microscope

机译：扫描近场微波显微镜的介电槽头
- 作者：Patrick Leidenberger;Christian Hafner
- 会议名称：《Conference on scanning microscopy》 | 2010年
- scanning near-field microwave microscope;
- double pass SNMM;
3.NEW Scanning Electron Microscope Magnification Calibration Reference Material (RM) 8820

机译：新的扫描电子显微镜放大倍数校准参考材料（RM）8820
- 作者：Michael T. Postek;Andras E. Vladar;William Keery;Michael Bishop;Benjamin Bunday;John Allgair
- 会议名称：《Conference on scanning microscopy》 | 2010年
- standards;
- scanning electron microscope;
- traceability;
- magnification;
- field of view;
- scale;
- calibration;
4.A new method of high resolution, quantitative phase scanning microscopy

机译：高分辨率，定量相扫描显微镜的新方法
- 作者：A. M. Maiden;J. M. Rodenburg;M. J. Humphry
- 会议名称：《Conference on scanning microscopy》 | 2010年
- coherent diffractive imaging;
- phase contrast;
- ptychography;
5.Advanced 3D Metrology Atomic Force Microscope with Crosstalk Eliminated

机译：消除了串扰的高级3D计量原子力显微镜
- 作者：Yueming Hua;Cynthia Coggins;Sung Park;Sang-il Park
- 会议名称：《Conference on scanning microscopy》 | 2010年
- AFM;
- SPM;
- crosstalk elimination;
- flexure scanner;
- critical angle measurement;
- 3D AFM;
- undercut;
- sidewall roughness;
6.GSR particles and their evidential value

机译：GSR颗粒及其证据价值
- 作者：Marek Kotrly;Ivana Turkova
- 会议名称：《Conference on scanning microscopy》 | 2010年
- forensic science;
- gunshot residues;
- GSR;
- contamination;
7.Measuring the beam size of a focused ion beam (FIB) system

机译：测量聚焦离子束（FIB）系统的束大小
- 作者：Jon Orloff
- 会议名称：《Conference on scanning microscopy》 | 2010年
8.Advances in Modeling of Scanning Charged-Particle-Microscopy Images

机译：扫描带电粒子显微镜图像的建模进展
- 作者：Petr Cizmar;Andras E. Vladar;Michael T. Postek
- 会议名称：《Conference on scanning microscopy》 | 2010年
9.Is this charred material from a VHS video cassette?

机译：这是从VHS录像带上烧焦的材料吗？
- 作者：Tara Fruchtenicht;Robert D. Blackledge;Teresa R. Williams
- 会议名称：《Conference on scanning microscopy》 | 2010年
- SEM;
- EDS;
- FT-IR;
- magnetic recording tape;
10.Optimizing the detector configuration for SEM topographic contrast using Monte Carlo simulation

机译：使用蒙特卡洛模拟为SEM地形对比度优化检测器配置
- 作者：Makoto Suzuki;Sergey Borisov;Sergey Babin;Hiroyuki Ito
- 会议名称：《Conference on scanning microscopy》 | 2010年
- SEM;
- Monte Carlo;
- detector;
- topographic contrast;
11.Pushing the Envelope with SEM/SDD-EDS Mapping: X-ray Spectrum Image Mapping in 30 Seconds or Less, But What Are the Real Limits?

机译：用SEM / SDD-EDS映射推动信封：30秒钟或更短的X射线光谱图像映射，但是真正的限制是什么？
- 作者：Dale Newbury
- 会议名称：《Conference on scanning microscopy》 | 2010年
12.Peering into the secrets of food and agricultural co-products

机译：窥探食品和农产品副产品的秘密
- 作者：Delilah Wood;Tina Williams;Gregory Glenn;Zhongli Pan;William Orts;Tara McHugh
- 会议名称：《Conference on scanning microscopy》 | 2010年
- microstructure;
- agricultural co-products;
- ag waste;
- minimal processing;
13.ELECTRON MICROSCOPY OF POLYMER-CARBON NANOTUBES COMPOSITES

机译：高分子碳纳米管复合材料的电子显微镜观察
- 作者：E.M. Campo;H. Campanella;Y. Y. Huang;K. Zinoviev;N. Torras;C. Tamargo;D. Yates;L. Rotkina;J. Esteve;E.M. Terentjev
- 会议名称：《Conference on scanning microscopy》 | 2010年
- polymer composites;
- carbon nanotubes;
- photoactuation;
- in-situ TEM;
- FIB;
14.Microstructure and texture analysis of advanced copper using Electron Backscattered Diffraction and Scanning Transmission Electron Microscopy

机译：电子背散射和扫描透射电子显微镜对高级铜的组织和织构分析
- 作者：R. Galand;L. Clement;P. Waltz;Y. Wouters
- 会议名称：《Conference on scanning microscopy》 | 2010年
- copper interconnect;
- EBSD;
- STEM;
- microstructure;
- electromigration;
- reliability;
- sample preparation;
15.A method for determining oceanic particle size distributions and particle composition using scanning electron microscopy coupled with energy dispersive spectroscopy

机译：一种使用扫描电子显微镜结合能量色散光谱法确定海洋粒径分布和粒子组成的方法
- 作者：Heather Groundwater;Michael S. Twardowski;Heidi M. Dierssen;Antoine Sciandre;Scott A.Freeman
- 会议名称：《Conference on scanning microscopy》 | 2010年
- particle size distribution;
- SEM;
- EDS;
- particulate scattering;
- image analysis;
- Arizona test dust;
- marine particles;
16.The Bayesian approach to reporting GSR analysis results: some first-hand experiences

机译：报告GSR分析结果的贝叶斯方法：一些第一手经验
- 作者：Sebastien Charles;Bart Nys
- 会议名称：《Conference on scanning microscopy》 | 2010年
17.Techniques for improving material fidelity and contrast consistency in secondary electron mode helium ion microscope (HIM) imaging

机译：二次电子模式氦离子显微镜（HIM）成像中提高材料保真度和对比度一致性的技术
- 作者：William Thompson;Lewis Stern;Dave Ferranti;Chuong Huynh;Larry Scipioni;John Notte;Colin Sanford
- 会议名称：《Conference on scanning microscopy》 | 2010年
- helium ion microscope;
- high resolution;
- surface sensitive;
- contamination reduction;
- argon cleaning;
18.Traceable nanoscale length metrology using a metrological Scanning Probe Microscope

机译：使用计量扫描探针显微镜可追溯的纳米级长度计量
- 作者：Malcolm Lawn;Jan Herrmann;Christopher H. Freund;John R. Miles;Malcolm Gray;Daniel Shaddock;Victoria A. Coleman;Asa K. Jaemting
- 会议名称：《Conference on scanning microscopy》 | 2010年
- mSPM;
- AFM;
- non-contact mode;
- quartz tuning fork;
- interferometry;
19.Interlaboratory Comparison of Traceable Atomic Force Microscope Pitch Measurements

机译：可溯源的原子力显微镜间距测量的实验室间比较
- 作者：Ronald Dixson;Donald A. Chernoff;Shihua Wang;Theodore V. Vorburger;Siew Leng Tan;Ndubuisi G. Orji;Joseph Fu
- 会议名称：《Conference on scanning microscopy》 | 2010年
- AFM;
- metrology;
- pitch;
- standards;
- calibration;
- traceability;
20.Low Tip Damage AFM Technique Development for Nano Structures Characterization

机译：用于纳米结构表征的低尖端损伤原子力显微镜技术的发展
- 作者：Biao Liu;Charles C Wang;Po-Fu Huang;Yuri Uritsky
- 会议名称：《Conference on scanning microscopy》 | 2010年
- amplitude modulation;
- AM-AFM;
- non-contact AFM;
- nano structures;
21.Scanning Methods Applied to Bitemark Analysis

机译：扫描方法应用于Bitemark分析
- 作者：Peter J Bush;Mary A. Bush
- 会议名称：《Conference on scanning microscopy》 | 2010年
- forensic odontology;
- bitemarks;
- bitemark research;
- SEM;
- skin;
- detail transfer;
22.The Influence of Surface Chemistry on GSR Particles: Using XPS to Complement SEM/EDS Analytical Techniques

机译：表面化学对GSR颗粒的影响：使用XPS补充SEM / EDS分析技术
- 作者：A. J. Schwoeble;Brian R. Strohmeier;John D. Piasecki
- 会议名称：《Conference on scanning microscopy》 | 2010年
- gunshot residue;
- SEM/EDS;
- surface chemistry;
- XPS;
23.Physico-chemical characterization of engineered metal oxide nanoparticles: the critical role of microscopy

机译：工程金属氧化物纳米粒子的理化特性：显微镜的关键作用
- 作者：A. La Fontaine;V. A. Coleman;A. K. Jaemting;M. Lawn;J. Herrmann;J. R. Miles
- 会议名称：《Conference on scanning microscopy》 | 2010年
- nanoparticles;
- sunscreen;
- extraction;
- transmission electron microscopy;
- dynamic light scattering;
24.Complementing and adding to SEM performance with addition of XRF, Raman, CL and PL spectroscopy and imaging

机译：通过添加XRF，拉曼光谱，CL和PL光谱学和成像来补充并提高SEM性能
- 作者：E. Leroy;S. Mamedov;E. Teboul;A. Whitley;D. Meyer;L. Casson
- 会议名称：《Conference on scanning microscopy》 | 2010年
- cathodoluminescence;
- EDX;
- EDXRF;
- SEM;
- scanning;
- Raman;
- photoluminescence;
25.Modeling of charging effects in scanning ion microscopes

机译：扫描离子显微镜中电荷效应的建模
- 作者：Kaoru Ohya;Takuya Yamanaka;Daiki Takami;Kensuke Inai
- 会议名称：《Conference on scanning microscopy》 | 2010年
- insulator;
- charging;
- scanning ion microscope;
- scanning electron microscope;
- secondary electron emission;
- monte carlo simulation;
26.Comprehensive simulation of SEM images taking into account local and global electromagnetic fields

机译：考虑局部和全局电磁场的SEM图像的全面模拟
- 作者：Sergey Babin;Sergey S. Borisov;Hiroyuki Ito;Andrei Ivanchikov;Dmitry Matison;Vladimir Militsin;Makoto Suzuki
- 会议名称：《Conference on scanning microscopy》 | 2010年
- scanning electron microscopy;
- Monte Carlo;
- charging;
- voltage contrast;
- electron trajectory;
- SEM simulation;
27.A novel Monte Carlo simulation code for linewidth measurement in critical dimension scanning electron microscopy

机译：用于临界尺寸扫描电子显微镜的线宽测量的新型Monte Carlo模拟代码
- 作者：Alexander Koschik;Mauro Ciappa;Stephan Holzer;Maurizio Dapor;Wolfgang Fichtner
- 会议名称：《Conference on scanning microscopy》 | 2010年
- critical dimension (CD) metrology;
- scanning electron microscopy (SEM);
- CD-SEM;
- Monte Carlo (MC) modeling;
- simulation;
28.A Feature-Based Approach for Processing Nanoscale Images

机译：基于特征的纳米图像处理方法
- 作者：Gregory Roughton;Aparna S. Varde;Stefan Robila;Jianyu Liang
- 会议名称：《Conference on scanning microscopy》 | 2010年
29.Dental Materials as an Aid for Victim Identification: Examination of Calcined Remains by SEM/EDS

机译：牙科材料帮助受害者识别：通过SEM / EDS检查煅烧后的残留物
- 作者：Mary A. Bush;Peter J Bush
- 会议名称：《Conference on scanning microscopy》 | 2010年
- forensic odontology;
- identification;
- cremation;
- SEM/EDS;
- composite resins;
- dental materials;
30.Investigation of Gunshot Residue Patterns using milli-XRF- Techniques: First Experiences in Casework

机译：使用Milli-XRF-技术研究枪声残留模式的研究：案例研究的初步经验
- 作者：Ruediger Schumacher;Martin Barth;Dieter Neimke;Ludwig Niewoehner
- 会议名称：《Conference on scanning microscopy》 | 2010年
31.Optimal Compression and Binarization of Signature Profiles for Automated Bullet Identification Systems

机译：自动项目符号识别系统的签名配置文件的最佳压缩和二值化
- 作者：Wei Chu;John Song;Theodore Vorburger;Robert Thompson;Thomas Renegar;Richard Silver
- 会议名称：《Conference on scanning microscopy》 | 2010年
- forensic science;
- bullet identification;
- striation marks;
- edge detection;
- signature profile;
- binarization;
32.Topography measurements for correlations of standard cartridge cases

机译：用于标准墨盒匣相关性的地形测量
- 作者：T.V. Vorburger;J. Song;W. Chu;T.B. Renegar;A. Zheng;J. Yen;R.M. Thompson;R. Silver;B. Bachrach;M. Ols
- 会议名称：《Conference on scanning microscopy》 | 2010年
- forensic science;
- ballistics identification;
- standard bullet;
- standard cartridge case;
- topography measurement;
- confocal;
33.Transmission-type angle deviation microscope with NA=0.65 for 3D measurement

机译：NA = 0.65的透射型角度偏差显微镜用于3D测量
- 作者：Ming-Hung Chiu;Chin-Fa Lai;Chen-Tai Ten;Yi-Zhi Lin
- 会议名称：《Conference on scanning microscopy》 | 2010年
- angle deviation microscopy (ADM);
- heterodyne interferometry;
- surface plasmon resonance;
- 3D measurement;
34.Resolution Improvement in Coherent Diffractive Imaging (Ptychography)

机译：相干衍射成像（色谱分析）的分辨率提高
- 作者：T B Edo;F Zhang;J M Rodenburg
- 会议名称：《Conference on scanning microscopy》 | 2010年
35.Performance of a combined chromatic confocal microscope with thin film interferometer

机译：彩色共焦显微镜与薄膜干涉仪的组合性能
- 作者：Florian Hirth;Thorbjoern C. Buck;Natasha Steinhausen;Alexander W. Koch
- 会议名称：《Conference on scanning microscopy》 | 2010年
- thin film reflectometry;
- chromatic shift;
- confocal measurement;
36.Numerical simulation of photonic crystal based nano-resonators on scanning probe tip for enhanced light confinement

机译：扫描探针尖端上基于光子晶体的纳米谐振器的数值模拟，用于增强光限制
- 作者：Lingyun Wang;Kazunori Hoshino;Xiaojing Zhang
- 会议名称：《Conference on scanning microscopy》 | 2010年
- scanning probe;
- FDTD;
- photonic crystal;
- slot waveguide;
- nano-resonator;
- light confinement;
37.Apple Cuticle-The Perfect Interface

机译：苹果表皮-完美的界面
- 作者：Eric Curry;Bruce Arey
- 会议名称：《Conference on scanning microscopy》 | 2010年
- physiological disorders;
- environmental stress;
- microcracking;
- microtubule;
- water stress;
38.Starch granule formation and protein deposition in wheat (Triticum aestivum L.) starchy endosperm cells is altered by high temperature during grain fill

机译：小麦籽粒填充过程中的高温改变了小麦（Triticum aestivum L.）淀粉质胚乳细胞中淀粉颗粒的形成和蛋白质沉积
- 作者：William J. Hurkman;Delilah F. Wood
- 会议名称：《Conference on scanning microscopy》 | 2010年
- endosperm;
- grain fill;
- high temperature;
- starch granules;
- protein bodies;
- wheat;
39.Quality and utilization of food co-products and residues

机译：食品副产品和残渣的质量和利用
- 作者：P. Cooke;G. Bao;C. Broderick;M. Fishman;L. Liu;C. Onwulata
- 会议名称：《Conference on scanning microscopy》 | 2010年
- pectin gel;
- atomic force microscopy;
- sugar beet pulp;
- poly(lactic acid);
- confocal microscopy;
- whey protein;
- extrusion;
- capsaicin;
40.Microstructure of Desmanthus illinoensis

机译：丹参木的显微结构
- 作者：Delilah F. Wood;William J. Orts;Gregory M. Glenn
- 会议名称：《Conference on scanning microscopy》 | 2010年
- microstructure;
- desmanthus illinoensis;
- illinois bundle flower;
- calcium oxalate crystals;
- phytin;
41.Microscopic examination on cytological changes in Allium cepa and shift in phytoplankton population at different doses of Atrazine

机译：显微镜下检查不同剂量阿特拉津对洋葱洋葱的细胞学变化和浮游植物种群迁移的影响
- 作者：Nabarun Ghosh;Kristen Finger;Samantha Usnick;William J. Rogers;A. B. Das;Don W. Smith
- 会议名称：《Conference on scanning microscopy》 | 2010年
- atrazine;
- allium chromosome;
- phytoplankton population;
- digital microscopy;
42.Characterization of Aeroallergen of Texas Panhandle using Scanning and Fluorescence Microscopy

机译：使用扫描和荧光显微镜表征德州Panhandle的空气过敏原
- 作者：Nabarun Ghosh;Mandy Whiteside;Chris Ridner;Yasemin Celik;C. Saadeh;Jeff Bennert
- 会议名称：《Conference on scanning microscopy》 | 2010年
- aeroallergen;
- SEM;
- fluorescence microscopy;
43.Identification of scanning probe microscopes sensor heads and validation of a mechanical model by a laser vibrometer

机译：通过激光振动计识别扫描探针显微镜传感器头部和机械模型的验证
- 会议名称：《Conference on scanning microscopy》 | 2009年
- SPM;
- STM;
- sensor head;
- tripod;
- identification;
- vibrometer;
- mechanical model;
44.Kelvin Probe Force Microscopy: Measurement Data Reconstruction

机译：Kelvin探针力显微镜：测量数据重建
- 会议名称：《Conference on scanning microscopy》 | 2009年
- kelvin probe force microscopy;
- KPFM;
- SPM;
- data reconstruction;
- point spread function;
- De-convolution;
45.Advanced methods in scanning X-ray microscopy

机译：扫描X射线显微镜中的先进方法
- 会议名称：《Conference on scanning microscopy》 | 2009年
46.Automated nanoscale AFM measurements using a-priori-knowledge

机译：自动化纳米级AFM测量使用a-priori-greature
- 会议名称：《Conference on scanning microscopy》 | 2009年
- AFM;
- a-priori-knowledge;
- coordinate measurement;
- nanometrology;
47.IMPLEMENTATION OF ION-BEAM TECHNIQUES IN MICROSYSTEMS MANUFACTURING: OPPORTUNITIES IN CELL BIOLOGY

机译：微系统制造中离子梁技术的实现：细胞生物学的机会
- 会议名称：《Conference on scanning microscopy》 | 2009年
- FIB;
- ICSI;
- cell handling;
- glass pipettes;
- embryo piercing;
48.Multiscale 3D Bioimaging: from cell, tissue to whole organism

机译：MultiScale 3D BioMimaging：从细胞，组织到整个生物体
- 会议名称：《Conference on scanning microscopy》 | 2009年
49.Transport Imaging with Near-Field Scanning Optical Microscopy

机译：运输成像与近场扫描光学显微镜
- 会议名称：《Conference on scanning microscopy》 | 2009年
- transport imaging;
- minority carrier;
- diffusion length;
- near field scanning optical microscopy;
- NSOM;
- nanowires;
50.The role of oxygen in secondary electron contrast of doped semiconductors in LVSEM

机译：氧气在LVSEM中掺杂半导体的二级电子对比的作用
- 会议名称：《Conference on scanning microscopy》 | 2009年
- secondary electron;
- dopant contrast;
- scanning electron microscopy;
- silicon;
- doped;
- oxide;
- carbon;
- metal oxide semiconductor;
51.Extreme high resolution scanning electron microscopy(XHR SEM) and beyond

机译：极端高分辨率扫描电子显微镜（XHR SEM）及更远
- 会议名称：《Conference on scanning microscopy》 | 2009年
- SEM;
- scanning electron microscope;
- STEM;
- transmission;
- monochromator;
- low voltage;
- resolution;
52.Recent Progress in Understanding the Imaging and Metrology using the Helium Ion Microscope

机译：使用氦离子显微镜了解成像和计量的最新进展
- 会议名称：《Conference on scanning microscopy》 | 2009年
- helium ion;
- microscopy;
- HIM;
- scanning electron microscope;
- SEM;
- nanomanufacturing;
- nanometrology;
53.FIB/SEM cell sectioning for intracellular metal granules characterization

机译：用于细胞内金属颗粒表征的FIB / SEM细胞切片
- 会议名称：《Conference on scanning microscopy》 | 2009年
- FIB sectioning;
- ultramicroscopy;
- isopod;
- metal granules;
- EDX;
- metal overload diseases;
54.A Control Approach to Cross Coupling Compensation of Piezotube Scanners in Tapping-mode Imaging

机译：一种控制压电管扫描仪在攻丝模式成像中交叉耦合补偿的控制方法
- 会议名称：《Conference on scanning microscopy》 | 2009年
55.Quantum dot conjugates for SEM of bacterial communities

机译：细菌社区SEM量子点缀合物
- 会议名称：《Conference on scanning microscopy》 | 2009年
- quantum dots;
- biotin;
- polymyxin B;
- ESEM;
- fluorescence;
56.Forensic document analysis using scanning microscopy

机译：使用扫描显微镜的法医文献分析
- 会议名称：《Conference on scanning microscopy》 | 2009年
- fraudulent documents;
- SEM/EDS;
- paper;
- inks;
- toners;
- security documents;
57.Solving the 'Micro-to-Macro' Spatial Scale Problem with Milliprobe X-ray Fluorescence/X-ray Spectrum Imaging

机译：用毫流X射线荧光/ X射线谱成像解决“微宏”空间尺度问题
- 会议名称：《Conference on scanning microscopy》 | 2009年
58.Characterizing Heterogeneous Particles with SEM/SDD-EDS Mapping and NIST Lispix

机译：用SEM / SDD-EDS映射和NIST LISPIX表征异构颗粒
- 会议名称：《Conference on scanning microscopy》 | 2009年
59.IR Analysis of Polyvinylidene Fluoride Doped With Transition Metal Halid

机译：用过渡金属卤化物掺杂聚偏二氟乙烯分析
- 会议名称：《Conference on scanning microscopy》 | 2009年
- polyvinylidene fluoride;
- metal halides;
- IR-analysis;
- precasting time;
- annealing;
- and corona poling;
60.SEM-EDX analysis of an unknown 'known' white powder found in a shipping container from Peru

机译：来自秘鲁的运输容器中未知的“已知”白色粉末的SEM-EDX分析
- 会议名称：《Conference on scanning microscopy》 | 2009年
- aluminum phosphide;
- fumigants;
- phosphine gas;
61.Monte Carlo Simulation to Determine the Measurement Uncertainty of a Metrological Scanning Probe Microscope Measurement

机译：Monte Carlo仿真以确定计量扫描探头显微镜测量的测量不确定性
- 会议名称：《Conference on scanning microscopy》 | 2009年
- monte carlo simulation;
- measurement uncertainty;
- metrological scanning probe microscopy;
- interferometer;
- SPM;
- AFM;
62.NEW PROSPECTS FOR ELECTRON BEAMS AS TOOLS FOR SEMICONDUCTOR LITHOGRAPHY

机译：电子束作为半导体光刻工具的新前景
- 会议名称：《Conference on scanning microscopy》 | 2009年
- electron beam lithography;
- throughput;
- shaped beams;
- massively parallel pixel exposure;
- Coulomb interaction;
- multi-beams;
- maskless lithography;
63.Novel choices for formulating embedding media kits

机译：制定嵌入式媒体套件的新选择
- 会议名称：《Conference on scanning microscopy》 | 2009年
- epoxy resins;
- anydrides;
- catalysts;
- embedding media;
- embedding kits;
64.Fresh fruit - microstructure, texture and quality

机译：新鲜水果 - 微观结构，质地和质量
- 会议名称：《Conference on scanning microscopy》 | 2009年
- fresh-cut roduce;
- fruits and vegetables;
- microstructure;
- parsley;
- carrot;
- broccoli;
- kiwifruit;
- mushroom;
65.Microstructure and nutrient distribution in oats: Influence on quality

机译：燕麦中的微观结构和营养分布：质量的影响
- 会议名称：《Conference on scanning microscopy》 | 2009年
- oats;
- quality;
- SEM;
- hull structure;
- nutrient distribution;
- micronization;
- instantizing;
- milling quality;
66.Methodologies for the preparation of soft materials using CryoFIB SEM

机译：使用Cryofib SEM制备软材料的方法
- 会议名称：《Conference on scanning microscopy》 | 2009年
- focused ion beam;
- FIB SEM;
- polymers;
- milling;
- ice etching;
- cold deposition;
- soft materials;
- biological samples;
67.Quality Assurance Aspects of GSR Analysis by SEM/EDX A Report of first-hand Experiences

机译：通过SEM / EDX将GSR分析的质量保证方面是一份第一手经验的报告
- 会议名称：《Conference on scanning microscopy》 | 2009年
68.Scanning Electron Microscopy in characterizing seeds of some Leguminous trees

机译：扫描电子显微镜表征一些豆科树的种子
- 会议名称：《Conference on scanning microscopy》 | 2009年
- scanning electron microscopy;
- seeds;
- leguminous trees;
- taxonomy;
69.XHR SEM: Enabling extreme high resolution scanning electron microscopy

机译：XHR SEM：实现极高分辨率的扫描电子显微镜
- 会议名称：《Conference on scanning microscopy》 | 2009年
- energy spread;
- chromatic aberration;
- low voltage;
- monochromator;
- surface sensitivity;
- SEM;
70.Microspectroscopic method for determination of size and distribution of protein complexes in vivo

机译：用于测定体内蛋白质复合物尺寸和分布的微型光谱法
- 会议名称：《Conference on scanning microscopy》 | 2009年
71.Variable probe current using a condenser lens in a miniature electron beam column

机译：在微型电子束柱中使用冷凝器镜头的可变探头电流
- 会议名称：《Conference on scanning microscopy》 | 2009年
- microscopy and microanalysis: instrumentation;
- SEM;
- tabletop SEM;
72.Construction of a new type of low-energy, scanning electron microscope with atomic resolution

机译：建设新型低能，扫描电子显微镜，原子分辨率
- 会议名称：《Conference on scanning microscopy》 | 2009年
- scanning tunneling microscopes;
- low energy electron microscopy (LEEM);
73.Test objects for automated dimensional measurements at the nanoscale level using a scanning electron microscope

机译：使用扫描电子显微镜测试纳米级电平的自动尺寸测量的测试对象
- 会议名称：《Conference on scanning microscopy》 | 2009年
- test object;
- scanning electron microscope;
- calibration;
- magnification;
- electron beam diameter;
74.Use of a Scanning Optical Profilometer for Toolmark Characterization

机译：使用扫描光学轮廓仪进行工具标记表征
- 会议名称：《Conference on scanning microscopy》 | 2009年
75.On the relationship between hidden Markov Models and convex functional transforms for simulating Scanning Probe Microscopy

机译：关于隐马尔可夫模型与模拟扫描探针显微镜模拟模型与凸起功能变换的关系
- 会议名称：《Conference on scanning microscopy》 | 2009年
- scanning probe microscopy;
- simulation;
- hidden markov models;
- legendre transform;
76.Russian Standards for Dimensional Measurements for Nanotechnologies

机译：俄罗斯纳米技术尺寸测量标准
- 会议名称：《Conference on scanning microscopy》 | 2009年
- nanometrology;
- standards;
- test object;
- scanning electron microscope;
- atomic force microscope;
77.Recent developments in the understanding and application of backscattered and secondary electrons in the SEM

机译：最近的开发在SEM中的反向散射和二次电子的理解和应用
- 会议名称：《Conference on scanning microscopy》 | 2009年
78.A novel Confocal Line Scanning Sensor

机译：新型共焦线扫描传感器
- 会议名称：《Conference on scanning microscopy》 | 2009年
- confocal microscopy;
- line scanning sensor;
- inclined focal plane;
79.X-Ray Analysis of Polyvinylidene Fluoride Doped with Transition Metal Halides

机译：聚偏二氟乙烯掺杂过渡金属卤化物的X射线分析
- 会议名称：《Conference on scanning microscopy》 | 2009年
- polyvinylidene fluoride;
- metal halides;
- X-ray diffraction;
- precasting time;
- annealing and corona poling;
80.Characterization of some biological specimens using TEM and SEM

机译：使用TEM和SEM的一些生物标本的表征
- 会议名称：《Conference on scanning microscopy》 | 2009年
81.Modeling of Charge and Discharge in Scanning Electron Microscopy

机译：扫描电子显微镜电荷和放电建模
- 会议名称：《Conference on scanning microscopy》 | 2009年
- charging;
- Monte Carlo;
- CD-metrology;
- CD-SEM;
- scanning microscopy;
- low voltage electrons;
82.Enabling Accurate Gate Profile Control With Inline 3D-AFM

机译：通过内联3D-AFM启用精确的栅极轮廓控制
- 会议名称：《Conference on scanning microscopy》 | 2009年
83.Applying fluorescence microscopy to the investigation of the behavior of foodborne pathogens on produce

机译：将荧光显微镜施加到食品中毒性病原体行为的调查
- 会议名称：《Conference on scanning microscopy》 | 2009年
- human pathogens;
- enteric pathogens;
- foodborne;
- bacteria;
- plants;
- produce;
- fruit;
- vegetables;
- microscopy;
- confocal;
- GFP;
84.Application of He ion microscopy for material analysis

机译：He离子显微镜在材料分析中的应用
- 会议名称：《Conference on scanning microscopy》 | 2009年
- helium ion beam microscopy;
- scanning microscopy;
- material analysis;
- microelectronics;
- polymer electronics;
85.Three-dimensional image formation under single-photon ultra-short pulsed illumination

机译：单光子超短脉冲照明下的三维图像形成
- 会议名称：《Conference on scanning microscopy》 | 2009年
86.Hybrid FDTD-Fresnel Modeling of the Scanning Confocal Microscopy

机译：扫描共聚焦显微镜的混合FDTD-菲涅耳建模
- 会议名称：《Conference on scanning microscopy》 | 2009年
- FDTD;
- confocal microscopy;
- imaging;
- fresnel;
87.Optimization of Accurate SEM Imaging by Use of Artificial Images

机译：用人工图像优化精确SEM成像
- 会议名称：《Conference on scanning microscopy》 | 2009年
88.Gunshot Residue Inserted Under Hair Scales as a Result of a Muzzle Blast

机译：由于枪口爆炸，在头发鳞片下插入枪口残留物
- 会议名称：《Conference on scanning microscopy》 | 2009年
- gunshot residue;
- muzzle blast;
- hair;
- hair scales;
- scanning electron microscopy;