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CHIP-DETECTING METHOD, CHIP-DETECTING STRUCTURE AND CHIP-CARRYING STRUCTURE

机译:芯片检测方法,芯片检测结构和芯片携带结构

摘要

A chip-detecting method, a chip-detecting structure and a chip-carrying structure are provided. The chip-detecting method includes providing a chip-detecting structure including a plurality of micro heater groups, a chip-carrying structure for carrying a plurality of chips, and a plurality of soldering material groups disposed between the chip-carrying structure and the chip-detecting structure; placing the chip-carrying structure and the chip-detecting structure adjacent to each other, so that each of the soldering material groups simultaneously contact the chip-carrying structure and the chip-detecting structure; respectively curing the low-temperature soldering material groups by heating of the micro heater groups, so that the chips are electrically connected to the chip-detecting structure respectively through the low-temperature soldering material groups that have been cured; and then detecting the chips so as to divide the chips into a plurality of good chips and a plurality of bad chips.
机译:提供了一种芯片检测方法,芯片检测结构和芯片承载结构。芯片检测方法包括提供包括多个微加热器组的芯片检测结构,用于承载多个芯片的芯片承载结构,以及设置在芯片携带结构和芯片之间的多个焊接材料组 - 检测结构;将芯片承载结构和彼此相邻的芯片检测结构放置,使得每个焊接材料组同时接触芯片携带结构和芯片检测结构;通过加热微加热器组分别固化低温焊接材料基团,使得芯片分别通过已固化的低温焊接材料组电连接到芯片检测结构;然后检测芯片以便将芯片分成多个良好的芯片和多个坏芯片。

著录项

  • 公开/公告号US2021384376A1

    专利类型

  • 公开/公告日2021-12-09

    原文格式PDF

  • 申请/专利权人 ASTI GLOBAL INC. TAIWAN;

    申请/专利号US202117341392

  • 发明设计人 CHIEN-SHOU LIAO;CHENG-CHIEH CHANG;

    申请日2021-06-08

  • 分类号H01L33;H01L21/66;H01L33/62;

  • 国家 US

  • 入库时间 2022-08-24 22:42:33

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