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High performance nanosheet fabrication method with enhanced high mobility channel elements

机译:高性能纳米片制造方法,具有增强的高迁移渠道元件

摘要

A semiconductor device includes a first transistor pair formed over a substrate. The first transistor pair includes a n-type transistor and a p-type transistor that are stacked over one another. The n-type transistor has a first channel region that includes one or more first nano-channels with a first bandgap value. The one or more first nano-channels extend laterally along the substrate, are stacked over the substrate and spaced apart from one another. The p-type transistor has a second channel region that includes one or more second nano-channels made of a compound material having a second bandgap value based on a predetermined material ratio of the compound material. The one or more second nano-channels extend laterally along the substrate, are stacked over the substrate and spaced apart from one another.
机译:半导体器件包括在基板上形成的第一晶体管对。 第一晶体管对包括n型晶体管和彼此堆叠的p型晶体管。 n型晶体管具有第一通道区域,该第一通道区域包括具有第一带隙值的一个或多个第一纳米通道。 沿基板横向延伸的一个或多个第一纳米通道在基板上堆叠并彼此间隔开。 p型晶体管具有第二沟道区,其包括由具有基于复合材料的预定材料比具有第二带隙值的复合材料制成的一个或多个第二纳米通道。 一个或多个第二纳米通道沿着基板横向延伸,堆叠在基板上并彼此间隔开。

著录项

  • 公开/公告号US11195832B2

    专利类型

  • 公开/公告日2021-12-07

    原文格式PDF

  • 申请/专利权人 TOKYO ELECTRON LIMITED;

    申请/专利号US201916592580

  • 发明设计人 MARK I. GARDNER;H. JIM FULFORD;

    申请日2019-10-03

  • 分类号H01L21;H01L27/092;H01L29/786;H01L29/161;H01L29/423;H01L21/8238;H01L29/24;

  • 国家 US

  • 入库时间 2022-08-24 22:38:30

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