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Methods and Apparatus for Determining Interference in MS Scan Data, Filtering Ions and Performing Mass Spectrometry Analysis on a Sample

机译:用于确定MS扫描数据,滤波离子和对样品进行质谱分析的干扰的方法和装置

摘要

A method of determining one or more interference parameters for a particular peak of an isotopic distribution corresponding to a precursor molecule in MS scan data is provided. The MS scan data comprises a plurality of peaks. Each peak has a mass-to-charge ratio and a relative abundance. The isotopic distribution comprises a subset of the plurality of peaks. The one or more interference parameters comprises a peak purity, pi, for the particular peak. The method comprises determining that there are no interfering peaks relevant to the isotopic distribution and determining that the peak purity, pi, for the particular peak should be a maximum purity value. Alternatively, the method comprises identifying one or more interfering peaks from the MS scan data, wherein the one or more interfering peaks do not belong to the subset of peaks of the isotopic distribution, and determining the peak purity, pi, for the particular peak based on: the relative abundance, Ii, of the particular peak, and the relative abundance of the one or more interfering peaks.
机译:提供了一种确定对应于MS扫描数据中的前体分子的同位素分布的特定峰的一个或多个干扰参数的方法。 MS扫描数据包括多个峰值。每个峰值具有质量对充电比和相对丰富。同位素分布包括多个峰的子集。一种或多种干扰参数包括特定峰值的峰纯度PI。该方法包括确定与同位素分布没有相关的干扰峰,并且确定特定峰值的峰纯度PI应该是最大纯度值。或者,该方法包括从MS扫描数据识别一个或多个干扰峰值,其中,一个或多个干扰峰不属于同位素分布的峰的子集,并确定基于特定峰的峰纯度PI。开:特定峰的相对丰度,II,以及一种或多种干扰峰的相对丰度。

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