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Method and Apparatus for Controlling Substrate DC-Bias and Ion Energy and Angular Distribution During Substrate Etching

机译:用于控制基板DC - 偏置和离子能量和基板蚀刻角分布的方法和装置

摘要

In addition to the impedance matching circuit provided in the radio frequency (RF) power transmission path to the bias electrode, a variable capacitor is provided in the RF transmission path to the bias electrode. The RF power supply operates in a pulsed mode to transmit pulses of RF power through the RF power transmission path to the bias electrode. The capacitance of the variable capacitor is set to control the rate of build-up of the DC bias voltage on the substrate present above the bias electrode during each pulse of RF power. The DC bias voltage build-up rate on the substrate controls the ion energy distribution and ion angular distribution in the plasma exposed to the electromagnetic field emanating from the substrate.
机译:除了设置在偏置电极的射频(RF)电力传输路径中提供的阻抗匹配电路之外,在RF传输路径中设置可变电容器到偏置电极。 RF电源以脉冲模式操作,以通过RF电力传输路径向偏置电极传输RF功率的脉冲。 设置可变电容器的电容以控制在RF功率的每个脉冲期间控制在偏置电极上方的基板上的DC偏置电压的积聚速率。 基板上的DC偏置电压积聚速率控制暴露于从基板发出的电磁场的等离子体中的离子能量分布和离子角分布。

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