首页> 外国专利> METHOD FOR QUANTIFYING FUNCTION OF TECHNOLOGY AND METHOD FOR ANALYZING TECHNOLOGICAL TREND USING THE SAME

METHOD FOR QUANTIFYING FUNCTION OF TECHNOLOGY AND METHOD FOR ANALYZING TECHNOLOGICAL TREND USING THE SAME

机译:使用相同的技术趋势的技术和方法函数的量化方法

摘要

Disclosed is a method capable of quantifying the relative importance of functional information in a target technology field and analyzing technology trends through this. A method for quantifying the function of a disclosed technology includes: receiving a patent set for a target technology domain obtained from a patent database; extracting a target verb according to a frequency of a verb described in a patent included in the patent set; and counting the number of cited patents including the target verb from among the cited patents citing the patent including the target verb, and calculating a function score for the target verb.
机译:公开了一种能够量化目标技术领域中功能信息的相对重要性,并通过此来分析技术趋势。 用于量化公开技术功能的方法包括:接收从专利数据库获得的目标技术结构域的专利集; 根据专利集中包含的专利中描述的动词的频率提取目标动词; 并计算引用专利包括目标动词的引用专利包括目标动词的专利的数量,并计算目标动词的函数分数。

著录项

  • 公开/公告号KR20210105449A

    专利类型

  • 公开/公告日2021-08-27

    原文格式PDF

  • 申请/专利权人 한양대학교 산학협력단;

    申请/专利号KR20200019359

  • 发明设计人 박현석;윤세준;문창배;

    申请日2020-02-18

  • 分类号G06Q10/06;G06F16/2458;G06F40/211;G06F40/216;

  • 国家 KR

  • 入库时间 2022-08-24 22:19:34

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