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POLARITY-WRITTEN CELL ARCHITECTURES FOR A MEMORY DEVICE

机译:用于存储器设备的极性写入的单元架构

摘要

Methods, systems, and devices for polarity-written cell architectures for a memory device are described. In an example, the described architectures may include memory cells that each include or are otherwise associated with a material configured to store one of a set of logic states based at least in part on a polarity of a write voltage applied to the material. Each of the memory cells may also include a cell selection component configured to selectively couple the material with an access line. In some examples, the material may include a chalcogenide, and the material may be configured to store each of the set of logic states in an amorphous state of the chalcogenide. In various examples, different logic states may be associated with different compositional distributions of the material of a respective memory cell, different threshold characteristics of the material of a respective memory cell, or other characteristics.
机译:描述了用于存储器设备的极性写入的单元架构的方法,系统和设备。 在一个示例中,所描述的架构可以包括每个包括或者与被配置为至少部分地基于施加到材料的写入电压的极性存储一组逻辑状态的材料的存储器单元。 每个存储器单元还可以包括小区选择分量,其被配置为用接入线选择性地将材料耦合。 在一些实例中,材料可包括硫属元素化物,并且该材料可以被配置为将每组逻辑状态存储在硫属化物的无定形状态中。 在各种示例中,不同的逻辑状态可以与相应存储器单元的材料的不同的组成分布相关联,相应存储器单元的材料的不同阈值特性或其他特征。

著录项

  • 公开/公告号EP3915114A1

    专利类型

  • 公开/公告日2021-12-01

    原文格式PDF

  • 申请/专利权人 MICRON TECHNOLOGY INC.;

    申请/专利号EP20190911850

  • 发明设计人 PIROVANO AGOSTINO;PELLIZZER FABIO;

    申请日2019-12-19

  • 分类号G11C13;

  • 国家 EP

  • 入库时间 2022-08-24 22:16:53

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