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POLARITY-WRITTEN CELL ARCHITECTURES FOR A MEMORY DEVICE
POLARITY-WRITTEN CELL ARCHITECTURES FOR A MEMORY DEVICE
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机译:用于存储器设备的极性写入的单元架构
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摘要
Methods, systems, and devices for polarity-written cell architectures for a memory device are described. In an example, the described architectures may include memory cells that each include or are otherwise associated with a material configured to store one of a set of logic states based at least in part on a polarity of a write voltage applied to the material. Each of the memory cells may also include a cell selection component configured to selectively couple the material with an access line. In some examples, the material may include a chalcogenide, and the material may be configured to store each of the set of logic states in an amorphous state of the chalcogenide. In various examples, different logic states may be associated with different compositional distributions of the material of a respective memory cell, different threshold characteristics of the material of a respective memory cell, or other characteristics.
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