首页> 外国专利> METHOD AND ARRANGEMENT FOR EVALUATING OR PREPARING AN EVALUATION OF A SAMPLE OF MEASUREMENT DATA FROM A MEASUREMENT OF A PLURALITY OF WORKPIECES

METHOD AND ARRANGEMENT FOR EVALUATING OR PREPARING AN EVALUATION OF A SAMPLE OF MEASUREMENT DATA FROM A MEASUREMENT OF A PLURALITY OF WORKPIECES

机译:用于评估或准备从多个工件的测量评估测量数据样本的评估的方法和装置

摘要

A method evaluates a sample of measurement data from measuring multiple workpieces by at least one coordinate measuring machine. A system of statistical distributions describes a frequency of measurement data values. The distributions are distinguishable based on skewness and kurtosis. The method includes defining a set of statistical distributions that are able to describe a frequency of measurement data values in the entire value interval from the system of statistical distributions for a value interval of the measurement data, which is a specified value interval or a value interval of the measurement data actually arising in the sample. The method includes ascertaining the skewness and the kurtosis from the sample of measurement data corresponding to a first statistical distribution. The method includes checking, using the ascertained moment values, whether the defined set contains a statistical distribution that has the ascertained skewness and kurtosis, and producing a corresponding test result.
机译:方法通过至少一个坐标测量机评估测量数据的样本测量数据测量多个工件。统计分布系统描述了测量数据值的频率。分布是基于偏光和峰度的可区分。该方法包括定义一组统计分布,其能够从统计分布的系统中的整个值间隔中的测量数据值的频率描述,用于测量数据的值间隔,这是指定值间隔或值间隔在样本中实际产生的测量数据的内容。该方法包括从对应于第一统计分布的测量数据的样本来确定偏斜和峰度。该方法包括使用所确定的矩值检查定义的集合是否包含具有确定的偏光和峰度的统计分布,并产生相应的测试结果。

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