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TEMPERATURE MEASUREMENT AND TEMPERATURE CALIBRATION METHODS AND TEMPERATURE MEASUREMENT SYSTEM

机译:温度测量和温度校准方法和温度测量系统

摘要

A temperature measurement method includes: a temperature calibrator with a first test structure of which a resistance forms a first functional relationship with a temperature is placed on a stage in a chamber; a temperature of the chamber is made to reach a set temperature; a voltage is applied to two opposite ends of the first test structure to obtain a corresponding current and a corresponding resistance; and an actual temperature of the temperature calibrator is acquired according to the resistance and the first functional relationship.
机译:温度测量方法包括:具有第一测试结构的温度校准器,其中电阻形成与温度的第一功能关系置于腔室中的阶段; 腔室的温度达到设定温度; 将电压施加到第一测试结构的两个相对端,以获得相应的电流和相应的电阻; 并且根据电阻和第一功能关系获得温度校准器的实际温度。

著录项

  • 公开/公告号US2021348972A1

    专利类型

  • 公开/公告日2021-11-11

    原文格式PDF

  • 申请/专利权人 CHANGXIN MEMORY TECHNOLOGIES INC.;

    申请/专利号US202117385022

  • 发明设计人 SHIHCHIEH LIN;

    申请日2021-07-26

  • 分类号G01K19;G01K7/18;H01L21/687;

  • 国家 US

  • 入库时间 2024-06-14 22:21:36

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