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TEMPERATURE MEASUREMENT METHOD, TEMPERATURE CALIBRATION METHOD AND TEMPERATURE MEASUREMENT SYSTEM

机译:温度测量方法,温度校准方法和温度测量系统

摘要

Provided is a temperature measurement method, comprising: placing a temperature calibration device of a first testing structure on a bearing table inside a chamber, wherein the first testing structure has a first function relationship between resistance and temperature; making the temperature of the chamber reach a set temperature; applying a voltage to two opposite ends of the first testing structure to obtain corresponding currents and resistance; and according to the resistance and the first function relationship, acquiring the actual temperature of the temperature calibration device. Further provided are a temperature calibration method and a temperature measurement apparatus, which are based on the temperature measurement method.
机译:提供了一种温度测量方法,包括:将第一测试结构的温度校准装置放置在腔室内的轴承台上,其中第一测试结构具有电阻和温度之间的第一功能关系; 使腔室的温度达到设定温度; 将电压施加到第一测试结构的两个相对端以获得相应的电流和电阻; 并根据阻力和第一功能关系,获取温度校准装置的实际温度。 进一步提供的是温度校准方法和温度测量装置,其基于温度测量方法。

著录项

  • 公开/公告号WO2021185158A1

    专利类型

  • 公开/公告日2021-09-23

    原文格式PDF

  • 申请/专利权人 CHANGXIN MEMORY TECHNOLOGIES INC.;

    申请/专利号WO2021CN80352

  • 发明设计人 LIN SHIHCHIEH;

    申请日2021-03-12

  • 分类号G01K7/16;

  • 国家 CN

  • 入库时间 2024-06-14 22:07:00

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