首页> 外国专利> IN-PLANE MAGNETIZED FILM, IN-PLANE MAGNETIZED FILM MULTILAYER STRUCTURE, HARD BIAS LAYER, MAGNETORESISTANCE EFFECT ELEMENT, AND SPUTTERING TARGET

IN-PLANE MAGNETIZED FILM, IN-PLANE MAGNETIZED FILM MULTILAYER STRUCTURE, HARD BIAS LAYER, MAGNETORESISTANCE EFFECT ELEMENT, AND SPUTTERING TARGET

机译:在平面内磁化薄膜,面内磁化薄膜多层结构,硬偏置层,磁阻效应元件和溅射靶

摘要

Provided is an in-plane magnetized film with which magnetic performance such as a coercive force Hc of at least 2.00 kOe and a residual magnetization Mrt per unit area of at least 2.00 memu/cm2 can be achieved without performing heating-type film formation. This in-plane magnetized film used as a hard bias layer (14) of a magnetoresistance effect element (12) contains metal Co, metal Pt, and an oxide and has a thickness of 20-80 nm, wherein: 45-80 at% of the metal Co and 20-55 at% of the metal Pt are contained with respect to the total amount of the metal components of said in-plane magnetized film; 3-25 vol% of the oxide is contained with respect to the whole in-plane magnetized film; and the average grain diameter of magnetic crystal grains of said in-plane magnetized film in the in-plane direction is 15-30 nm.
机译:提供了平面磁化薄膜,其磁性性能,例如矫顽力Hc至少2.00只koe的矫顽力Hc,并且可以在不进行加热型膜形成的情况下实现至少2.00 Memu / cm2的每单位面积。 用作磁阻效应元件(12)的硬偏置层(14)的平面内磁化膜含有金属CO,金属Pt和氧化物,厚度为20-80nm,其中:45-80at% 金属CO和20-55的金属Pt的含量相对于所述平面内磁化薄膜的金属组分的总量含有; 3-25体积%的氧化物相对于全平面内磁化薄膜含有; 并且在面内方向上的所述内面磁化膜的磁性晶粒的平均粒径为15-30nm。

著录项

  • 公开/公告号WO2021221096A1

    专利类型

  • 公开/公告日2021-11-04

    原文格式PDF

  • 申请/专利权人 TANAKA KIKINZOKU KOGYO K.K.;

    申请/专利号WO2021JP16941

  • 申请日2021-04-28

  • 分类号G11B5/31;G11B5/39;H01F10/16;H01F10/32;H01L43/08;H01L29/82;C23C14/34;

  • 国家 JP

  • 入库时间 2022-08-24 22:06:45

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