首页> 外国专利> TEST SYSTEM FOR COMPACT MULTI-BAND, NEAR-FIELD TO FAR-FIELD AND DIRECT FAR-FIELD

TEST SYSTEM FOR COMPACT MULTI-BAND, NEAR-FIELD TO FAR-FIELD AND DIRECT FAR-FIELD

机译:紧凑型多频段,近场到远场的测试系统

摘要

The invention discloses a hybrid compact, near-field-to-far-field and direct-far-field test system in an anechoic chamber. It comprises a curved reflector with its primary feed antenna set situated on a lateral side and pointing towards it, a secondary feed antenna set pierced to the reflector or in front of it, and one or several sets of antennas or devices under test (AUT/DUT), and their 3D turntable tower placed at a quiet zone, for which roll, elevation and azimuth can change. In a receive process, the primary antenna set transmits several signals towards the reflector, which reflects these signals towards the quiet zone in the form of planar wavefronts. The secondary antenna set also transmits several signals, but directly towards the quiet zone in spherical wavefronts. The AUT/DUT receives all these signals simultaneously. Through reciprocity, a similar measurement process for transmission can be performed.
机译:本发明公开了一种在AneChice室中的混合体紧凑,近场到远场和直接远场测试系统。 它包括弯曲反射器,其主馈送天线组位于横向侧并指向其,次馈送天线组被刺穿到反射器或其前面,以及被测的一个或多组天线或设备(aut / DUT),他们的3D转盘塔放置在一个安静的区域,滚动,高度和方位角可以改变。 在接收过程中,主天线组向反射器发送若干信号,这将这些信号反射到平面波前的形式的静音区域。 次级天线组还发送若干信号,但直接朝向球形波前的静音区域。 AUT / DUT同时接收所有这些信号。 通过互动性,可以执行类似的传输测量过程。

著录项

  • 公开/公告号US2021341528A1

    专利类型

  • 公开/公告日2021-11-04

    原文格式PDF

  • 申请/专利权人 EMITE INGENIERIA S.L.;

    申请/专利号US201817283448

  • 发明设计人 DAVID AGAPITO SANCHEZ HERNANDEZ;

    申请日2018-10-09

  • 分类号G01R29/10;H01Q13/02;H01Q21/24;H01Q1/38;H01Q15/14;

  • 国家 US

  • 入库时间 2022-08-24 22:05:00

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