Improved risk based inspection including a method for providing a repair priority parameter for a processing device in a processing plant, wherein the method comprises the steps of: - providing, in a server, a criticality database, wherein the criticality database comprises for a plurality of processing devices in said processing plant at least one inspection routine, wherein each of the inspection routines has associated therewith a critically score; - receiving in a server, from a user terminal, a result parameter associated with an inspection routine associated with said processing device, wherein the result parameter is indicative for a pass or a fail of said inspection routine; - retrieving, if said received result parameter is indicative for a fail, from said criticality database the criticality score associated with said failed routine and said processing device; and - defining said repair priority parameter for said processing device based on the retrieved criticality score.
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