首页> 外国专利> A method for double-sided grinding of workpieces and a device for double-sided grinding of workpieces

A method for double-sided grinding of workpieces and a device for double-sided grinding of workpieces

机译:一种双面研磨工件的方法和用于双面研磨工件的装置

摘要

The method for double-side polishing of a workpiece of the present invention includes a pre-polishing index calculation step of calculating an index Xp for a workpiece subjected to double-side polishing after double-side polishing in a previous batch, and a predetermined predictive formula, a target polishing time calculation step of calculating a target polishing time in In addition, the double-sided polishing apparatus for a workpiece according to the present invention comprises: a measurement unit for measuring the thickness of the workpiece subjected to the double-side polishing after double-side polishing in the previous batch; a first calculation unit for calculating the index Xp; A second calculation unit for calculating the target polishing time Tt in the current batch by using the prediction equation of
机译:本发明工件的双面抛光的方法包括预抛光指数计算步骤,其计算在先前批次中双面抛光后进行双侧抛光的工件的索引XP的预抛光指数计算步骤,以及预定的预测性 公式,目标抛光时间计算步骤,计算目标抛光时间,根据本发明的工件的双面抛光装置包括:测量单元,用于测量经受双侧的工件的厚度 在前一批双面抛光后抛光; 用于计算索引XP的第一计算单元; 通过使用预测方程计算当前批次中的目标抛光时间TT的第二计算单元

著录项

  • 公开/公告号KR20210126122A

    专利类型

  • 公开/公告日2021-10-19

    原文格式PDF

  • 申请/专利权人 가부시키가이샤 사무코;

    申请/专利号KR1020217030199

  • 发明设计人 미야자키 유지;

    申请日2019-12-26

  • 分类号B24B37/005;B24B37/08;B24B37/12;B24B37/34;B24B49/03;H01L21/67;

  • 国家 KR

  • 入库时间 2022-08-24 21:45:57

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号