首页>
外国专利>
LED wafer, LED wafer detection device, and LED wafer detection method
LED wafer, LED wafer detection device, and LED wafer detection method
展开▼
机译:LED晶圆,LED晶片检测装置和LED晶片检测方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
An LED wafer, an LED wafer detection device and an LED wafer detection method are provided. The LED wafer includes a wafer base, a plurality of LED chips, a plurality of positive test circuit layers, a plurality negative test circuit layers, a plurality of positive test contacts, and a plurality of negative test contacts. Each LED chip has a positive contact and a negative contact respectively electrically connected to the corresponding positive test circuit layer and the corresponding negative test circuit layer. The positive test contacts are respectively electrically connected to the positive test circuit layers, and the negative test contacts are respectively electrically connected to the negative test circuit layers. Whereby, when inputting an electric current into the positive test contacts, and then outputting the electric current from the negative test contacts, each LED chip is excited to generate a light source.
展开▼