METHOD FOR ANALYZING COMPOSITION OF ELECTRONIC/ELECTRICAL APPARATUS COMPONENT LAYER, METHOD FOR PROCESSING ELECTRONIC/ELECTRICAL APPARATUS COMPONENT LAYER, DEVICE FOR ANALYZING COMPOSITION OF ELECTRONIC/ELECTRICAL APPARATUS COMPONENT LAYER, AND DEVICE FOR PROCESSING ELECTRONIC/ELECTRICAL APPARATUS COMPONENT LAYER

摘要

Provided are a method for analyzing the composition of an electronic/electrical apparatus component layer, a method for processing an electronic/electrical apparatus component layer, a device for analyzing the composition of an electronic/electrical apparatus component layer, and a device for processing an electronic/electrical apparatus component layer that make it possible to improve the precision of image recognition, and to efficiently analyze the component layer composition of an electronic/electrical apparatus component layer irrespective of the experience or skill of a person. A method for analyzing the composition of an electronic/electrical apparatus component layer, the method including: extracting an electronic/electrical apparatus component layer from within a captured image in which is captured a raw material including a plurality of electronic/electrical apparatus component layers including a plurality of types of components, through use of an image recognition process in which is used a machine learning system, and then performing compositional analysis; and setting the reliability of the machine learning system to a first threshold value when information about the raw material constituting the subject of compositional analysis is reflected in learning data used in learning by the machine learning system, or setting said reliability to a second threshold value lower than the first threshold value and extracting an electronic/electrical apparatus component layer when information about the raw material constituting the subject of compositional analysis is not reflected in the learning data.