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A METHOD AND A SYSTEM FOR ENABLING ESTIMATION OF AN INITIAL POINT OF INTERACTION OF AN X-RAY PHOTON IN A PHOTON-COUNTING X-RAY DETECTOR
A METHOD AND A SYSTEM FOR ENABLING ESTIMATION OF AN INITIAL POINT OF INTERACTION OF AN X-RAY PHOTON IN A PHOTON-COUNTING X-RAY DETECTOR
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机译:一种方法和系统,用于实现光子计数X射线检测器中X射线光子的初始相互作用的初始点
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摘要
The disclosed method enables estimating an initial point of interaction of an x-ray photon in a photon-counting x-ray detector, based on a number of x-ray detector sub-modules or wafers, each including detector elements. The x-ray detector sub-modules are oriented in edge-on geometry with the edge directed towards the x-ray source, assuming the x-rays enter through the edge. Each detector sub-module or wafer has a thickness with two opposite sides of different potentials to enable charge drift towards the side, where the detector elements, also referred to as pixels, are arranged. Basically, the method includes: determining an estimate of charge diffusion originating from a Compton interaction or an interaction through photoeffect related to the x-ray photon in a detector sub-module or wafer of the x-ray detector; and estimating the initial point of interaction along the thickness of the detector sub-module based on the determined estimate of charge diffusion.
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