SEMICONDUCTOR AUTOMATIC TEST EQUIPMENT FOR IMPROVING TEST FLOW EFFICIENCY, AND TESTING METHOD

摘要

A semiconductor automatic test apparatus for improving test flow efficiency, and a testing method, The method comprising database building steps and testing steps; the database building steps comprise: establishing a test item data table and a test type data table within a database, the test item data table being a table using test items as dimensions and storing data for each test item (S11), and selecting a test item template according to a test type, so as to newly construct test item data within the test type data table (S12); the testing steps comprise: receiving, from an equipment end, a test type request of a needed test (S21), and obtaining necessary test item data according to a test item ID or a test item name within the test item data table that corresponds to the test type (S22); and sending, to the equipment end, a piece of information and a code file correspondingly pointed to by the test item data (S23).