首页> 外国专利> SYSTEM FOR THERMALLY INFLUENCING A CRACK TIP OF CRACK WITHIN A SPECIMEN AND RELATED METHODS

SYSTEM FOR THERMALLY INFLUENCING A CRACK TIP OF CRACK WITHIN A SPECIMEN AND RELATED METHODS

机译:在样品和相关方法内热影响裂纹裂纹尖端的系统

摘要

A testing system for causing a physical change in a crack tip region of a crack within a specimen. The testing system includes a load application system for applying a load to the specimen having the crack formed therein, an electrothermal system for applying an electrical current through the specimen and comprising a power supply and a controller operably coupled to the load application system and the electrothermal system. The load application system configured to perform a crack growth test on the specimen. A method of thermally influencing a crack tip region of a crack within a specimen includes applying at least one pulse of current to the specimen to generate flux tangentially around the crack within the specimen and at the crack tip region and causing the crack tip region of the crack within the specimen to reach a predetermined activation temperature.
机译:一种测试系统,用于在样本内的裂纹的裂纹尖端区域中的物理变化。 测试系统包括负载施加系统,用于将负载施加到具有形成在其中的裂缝的样本,用于通过样本施加电流并且包括电源的电热系统和可操作地连接到负载应用系统和电热的控制器。 系统。 负载施加系统被配置为在样本上进行裂纹生长试验。 热影响样本内的裂纹的裂纹尖端区域的方法包括将至少一个电流脉冲施加到样本中以产生围绕样品内的裂缝和裂缝尖端区域的裂缝产生磁通并导致裂纹尖端区域 标本内的裂缝达到预定的活化温度。

著录项

  • 公开/公告号US2021262960A1

    专利类型

  • 公开/公告日2021-08-26

    原文格式PDF

  • 申请/专利权人 FRACTURELAB LLC;

    申请/专利号US202117316251

  • 发明设计人 RICHARD PETTIT;

    申请日2021-05-10

  • 分类号G01N25/72;G01N3/38;G01N25/12;G01N29/06;G01N21/88;

  • 国家 US

  • 入库时间 2022-08-24 20:48:12

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