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Distance measuring method, optical comb distance meter, and optical three-dimensional shape measuring apparatus

机译:距离测量方法,光梳距表和光三维形状测量装置

摘要

Problem to be solved: to provide a distance measuring method capable of measuring a distance to a subject continuously and accurately over a wide measurement range beyond a limit of a half wavelength measurement range, a distance meter and an optical three-dimensional shape measuring apparatus.Solution: first optical com reference light and measurement light of a first wavelength band in which the center frequency is different from each other are emitted from a first light sourceThe second optical comb reference light and the measurement light in the second wavelength band are emitted from the second light sourceReference light S1 which combined first and second reference lightThe measurement light S2 which has combined the first and second measurement light is incident on the interferometer 13.The reference interference light S3 obtained by combining the reference light S1 and the measuring light S2 and the reference light S1 passing through the reference optical path 21 of the reference optical path length L1 and the measurement light S2 passing through the measuring optical path 51 are combined to generate the measuring interference light S4.The phase difference between the first and second reference and measurement interference light signals obtained by detecting the interference light S3 obtained by the interferometer 13 and the interference light S4 obtained by the interferometer 13 by the signal processing section 17The distance L2 to the object is calculated.Diagram
机译:要解决的问题:提供一种距离测量方法,其能够在宽的测量范围内连续,准确地测量与对象的距离超出半波长测量范围,距离计和光学三维形状测量装置的极限。解决方案:第一波长带的第一光学COM参考光和测量光,其中中心频率彼此不同地从第一光求耦合光发射,第二波长带中的测量光从第二光糖型光S1组合第一和第二参考光的测量光S2组合的第一和第二测量光在干涉仪13上入射。通过组合参考光S1和测量光S2而获得的参考干涉光S3通过参考光路长度L1的参考光路21的参考光S1和通过测量光路51的测量光S2以产生测量干涉光S4。第一和第二参考和测量之间的相位差通过检测int获得的干涉光信号由干涉仪13获得的擦除光S3和通过信号处理部分17由干涉仪17获得的干涉光S4对象的距离L2是距离L2 .diagram

著录项

  • 公开/公告号JP2021120654A

    专利类型

  • 公开/公告日2021-08-19

    原文格式PDF

  • 申请/专利权人 株式会社XTIA;

    申请/专利号JP20200014230

  • 发明设计人 興梠 元伸;今井 一宏;

    申请日2020-01-30

  • 分类号G01B9/027;

  • 国家 JP

  • 入库时间 2022-08-24 20:42:52

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