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Distance meter, distance measuring method and optical three-dimensional shape measuring machine

机译:测距仪,测距方法和光学三维形状测量机

摘要

PROBLEM TO BE SOLVED: To provide a range finder and a range finding method capable of measuring a long distance highly accurately in a short time.;SOLUTION: An interference signal acquired by detecting by a reference light detector 3, interference light S3 between reference light S1 emitted from a first light source 1 and irradiated onto a reference surface 4 and measuring light S2 emitted from a second light source 2 and irradiated onto a measuring surface 6, and an interference signal acquired by detecting by a measuring light detector 6, interference light S4 between reference light S1' reflected by the reference surface 4 and measuring light S2' reflected by the measuring surface 5, are supplied to a signal processing part 7. Then, a difference between a distance to the reference surface and a distance to the measuring surface is determined from the velocity of light and a refractive index in a measured wavelength based on a time difference between the interference signal acquired by detecting the interference light S3 and the interference signal acquired by detecting the interference light S4 by the signal processing part 7.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:提供一种能够在短时间内高精度地测量远距离的测距仪和测距方法。解决方案:通过参考光检测器3进行检测而获得的干涉信号,干涉光S 在从第一光源1发射并照射到参考表面4上的参考光S 1 与测量从第二光源2发射的光S 2 之间的3 并照射到测量表面6上,并通过测量光检测器6进行检测获得的干涉信号,由参考反射的参考光S 1 '之间的干涉光S 4 表面4和被测量表面5反射的测量光S 2 '被提供给信号处理部分7。然后,到基准表面的距离与到测量表面的距离之差为由光速和所测波长ba的折射率确定在信号处理部7中,对通过检测出干涉光S 3 而获得的干涉信号与通过检测出干涉光S 4 而获得的干涉信号之间的时间差进行选择。 ;版权:(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP5231883B2

    专利类型

  • 公开/公告日2013-07-10

    原文格式PDF

  • 申请/专利权人 株式会社 光コム;

    申请/专利号JP20080174860

  • 发明设计人 今井 一宏;太田 和哉;興梠 元伸;

    申请日2008-07-03

  • 分类号G01B9/02;G01S17/32;G01B11/24;G01C3/06;

  • 国家 JP

  • 入库时间 2022-08-21 16:55:34

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