a substrate (102),a first layer (106) of AlxGayIn(1-x-y)N disposed on the substrate,stacks (107, 109) of several second and third layers (108, 110) alternating against each other, between the substrate and the first layer,a fourth layer (112) of AlxGayIn(1-x-y)N, between the stacks,a relaxation layer of AIN disposed between the fourth layer and one of the stacks, and, in each of the stacks:the level of Ga of the second layers increases from one layer to the next in a direction from the substrate to the first layer,the level of Ga of the third layers is constant or decreasing from one layer to the next in said direction, the average mesh parameter of each group of adjacent second and third layers increasing from one group to the next in said direction,the thickness of the second and third layers is less than 5 nm."/> Semiconductor structure having a group iii-v semiconductor layer comprising a hexagonal mesh crystalline structure
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Semiconductor structure having a group iii-v semiconductor layer comprising a hexagonal mesh crystalline structure

机译:具有包含六边形网晶结构的III-V半导体层的半导体结构

摘要

A semiconductor structure (100) comprising:a substrate (102),a first layer (106) of AlxGayIn(1-x-y)N disposed on the substrate,stacks (107, 109) of several second and third layers (108, 110) alternating against each other, between the substrate and the first layer,a fourth layer (112) of AlxGayIn(1-x-y)N, between the stacks,a relaxation layer of AIN disposed between the fourth layer and one of the stacks, and, in each of the stacks:the level of Ga of the second layers increases from one layer to the next in a direction from the substrate to the first layer,the level of Ga of the third layers is constant or decreasing from one layer to the next in said direction, the average mesh parameter of each group of adjacent second and third layers increasing from one group to the next in said direction,the thickness of the second and third layers is less than 5 nm.
机译:包含:半导体结构( 100 ): 基板( 102 ), 第一层( 106 )Al x ga y 在设置在衬底上的(1-xy) n中, 堆叠( 107,109 )的几个和第三层( 108,110 )相互交替,在基板和第一之间相互交替图层, Al x ga y < / sub>在(1-xy) n之间,堆栈之间, 在第四个之间设置的ain弛豫层层和其中一个堆栈,以及在每个堆栈中: 第二层的Ga的级别从一个图层增加到下一个层从基板到第一层的方向, 第三层的Ga的水平是恒定的或从一个层延伸到所述方向上的下一个层,相邻的第二和第三层的每组的平均网格参数从一个组增加到下一个方向上的下一个, 第二个和厚度第三层小于5nm。

著录项

  • 公开/公告号US11081346B2

    专利类型

  • 公开/公告日2021-08-03

    原文格式PDF

  • 申请/专利号US201515527466

  • 发明设计人 MATTHEW CHARLES;

    申请日2015-11-17

  • 分类号H01L29/06;H01L21/02;H01L33/06;H01L33/32;H01L33/12;H01L29/10;H01L29/778;H01L23;H01L29/15;H01L29/20;H01L33/30;H01L29/207;

  • 国家 US

  • 入库时间 2022-08-24 20:18:02

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