METHOD FOR DETERMINING PERMITTIVITY OF LAYERS OF MULTILAYER MATERIALS

摘要

FIELD: measuring equipment. ;SUBSTANCE: invention relates to measurement technology, in particular to the measurement of the dielectric permittivity of multilayer materials. Essence: the method includes measuring the thickness of the sample layers, setting the resonator to resonance without a sample, measuring the length of the resonator at a fixed frequency, placing a sample in the resonator laid with one side on a movable piston, setting the resonator to resonance with the sample and measuring the length of the resonator with the sample at a fixed frequency, calculating the magnitude of the change in the length of the resonator empty and with the sample laid with one side on a movable piston. In addition, the same sample is placed in the resonator, laid with the reverse side on a movable piston, the resonator is tuned in resonance with the sample and the length of the resonator with the sample is measured at a fixed frequency. The dielectric permittivity of each layer of the sample is calculated using the values of the change in the length of the resonator for the positions of the sample laid by one and the other sides on the movable piston of the sample, using the values of the change in the length of the resonator for the positions of the sample laid by one and the other sides on the movable piston. ;EFFECT: method includes measuring the thickness of the sample layers, setting the resonator to resonance without a sample, measuring the length of the resonator at a fixed frequency.;1 cl, 1 tbl