首页> 外国专利> PERFORMANCE TEST APPARATUS OF WAVE HEIGHT MEASURING INSTRUMENT AND EXPERIMENT METHOD OF MODEL SHIP USING THE SAME

PERFORMANCE TEST APPARATUS OF WAVE HEIGHT MEASURING INSTRUMENT AND EXPERIMENT METHOD OF MODEL SHIP USING THE SAME

机译:使用相同的波高测量仪器和模型船舶实验方法的性能试验装置

摘要

A performance testing apparatus for a wave height measurement device according to an embodiment of the present invention includes: a first body to which a plurality of first support parts of the wave height measurement instrument for measuring the wave height of a model ship installed in a towing tank are attached; a second body to which a plurality of second supports of the wave height meter corresponding to the first support are attached and spaced apart from the first body; a connecting post connecting the first body and the second body; And a gap adjuster connected to the connection pillar and adjusting the distance between the first body and the second body to adjust the lengths of the plurality of measurement lines connecting the plurality of first support parts and the plurality of second support parts; include
机译:根据本发明的实施例的用于波高测量装置的性能测试装置包括:第一主体,用于测量安装在牵引中的模型船的波形高度的波高测量仪的多个第一支撑部分坦克附有;与第一支撑件相对应的波高表的多个第二支撑件的第二主体附接并与第一主体间隔开来;连接第一主体和第二个主体的连接柱;和一个连接到连接柱的间隙调节器,并调节第一主体和第二主体之间的距离,以调节连接多个第一支撑部件和多个第二支撑部件的多条测量线的长度;包括

著录项

  • 公开/公告号KR20210078628A

    专利类型

  • 公开/公告日2021-06-29

    原文格式PDF

  • 申请/专利权人 대우조선해양 주식회사;

    申请/专利号KR1020190169932

  • 发明设计人 한지수;김진해;

    申请日2019-12-18

  • 分类号G01M10;G01M99;

  • 国家 KR

  • 入库时间 2022-08-24 19:51:45

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