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ANGLE RESOLVED SPECTRAL REFLECTOMETRY USING SPATIAL LIGHT MODULATOR

机译:角度解析光谱反射测量使用空间光调制器

摘要

An angle-resolved spectroreflectometer for measuring a physical quantity of a sample, wherein the angle-resolved spectroreflectometer modulates a beam-cross-section of light with respect to light received from a light source into a shape of a predetermined first image spatial light modulator (SLM); an objective lens that receives the modulated light and makes it incident on the sample, and receives and passes the light reflected from the sample; a spectrometer that receives the light passing through the objective lens and measures the intensity of the reflected light according to the wavelength as an electrical signal; includes
机译:用于测量样品的物理量的角度分辨光谱反向计,其中角度分辨光谱反射计相对于从光源接收到预定的第一图像空间光调制器的形状的光调制光的光束横截面( SLM);一种物镜,其接收调制光并使其入射在样品上,并接收并通过从样品反射的光;一种光谱仪,其接收通过物镜的光并测量根据波长作为电信号的反射光的强度;包括

著录项

  • 公开/公告号KR102270190B1

    专利类型

  • 公开/公告日2021-06-28

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR1020200041068

  • 发明设计人 박희재;최가람;김진용;김민규;

    申请日2020-04-03

  • 分类号G01N21/55;G01J3/02;G01N21/41;G02F1/13;

  • 国家 KR

  • 入库时间 2024-06-14 21:46:35

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