Apparatus And Method For Repairable Memory Classification

摘要

According to the present invention, information on a single bad memory cell in which other bad memory cells do not exist in the same row and column of the memory cell array and a plurality of bad memory cells are obtained from the location information of the bad memory cells applied as a result of a test for the memory cell array. Row rare defect information for a row in which this exists, column scarce defect information for a column in which a plurality of defective memory cells exist, and cross memory cell information overlapped with the row rare defect information and column rare defect information are obtained and stored. If the difference between the number of single defective memory cells and the number of redundancy, which is the sum of the number of cell analyzer and row redundancy and column redundancy, is equal to or greater than the number of rare defective lines that is the sum of the number of column rare defective information and the number of column rare defective information, the semiconductor memory is a repairable memory Including a repairable determination unit that determines that the memory cell is in repairable memory, the non-repairable memories are quickly selected through a predetermined simple calculation after the memory cell test to be excluded from repair, thereby reducing the analysis time and repair time for the non-repairable memory, thereby reducing the overall cost It is possible to provide an apparatus and method for sorting a repairable semiconductor memory that can significantly reduce the total repair time directly related to the .