首页> 外国专利> COMPOSITION FOR CHEMICAL MECHANICAL POLISHING, CHEMICAL MECHANICAL POLISHING METHOD, AND METHOD FOR MANUFACTURING PARTICLES FOR CHEMICAL MECHANICAL POLISHING

COMPOSITION FOR CHEMICAL MECHANICAL POLISHING, CHEMICAL MECHANICAL POLISHING METHOD, AND METHOD FOR MANUFACTURING PARTICLES FOR CHEMICAL MECHANICAL POLISHING

机译:用于化学机械抛光,化学机械抛光方法的组合物和制造化学机械抛光颗粒的方法

摘要

Provided are a composition for chemical mechanical polishing and a chemical mechanical polishing method, which enable reduction in occurrence of surface defects in a polished surface and which enable high speed polishing of a tungsten film which is a wiring material. The composition for chemical mechanical polishing according to the present invention contains: (A) particles containing alumina and having a functional group represented by general formula (1); and (B) a liquid medium. (1): -SO3-M+ (In the formula, M+ represents a monovalent cation.)
机译:提供了一种用于化学机械抛光和化学机械抛光方法的组合物,其能够降低抛光表面中表面缺陷的发生,并且能够高速抛光钨膜,其是布线材料。根据本发明的化学机械抛光组合物含有:(a)含有氧化铝的颗粒并具有通式(1)表示的官能团; (b)液体介质。 (1):-SO 3 - m + (在式中,m + 代表一价阳离子。 )

著录项

  • 公开/公告号WO2021124771A1

    专利类型

  • 公开/公告日2021-06-24

    原文格式PDF

  • 申请/专利权人 JSR CORPORATION;

    申请/专利号WO2020JP42918

  • 申请日2020-11-18

  • 分类号C09K3/14;B24B37;H01L21/304;

  • 国家 JP

  • 入库时间 2022-08-24 19:36:41

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