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Thermophysical property value measuring device and thermophysical characteristic value measuring method

机译:热物理价值测量装置和热物理特征测量方法

摘要

In the thermophysical characteristic value measuring device (1), a light-shielding body (11) that shields light from light except for an opening is provided so as to face the surface of the sample thin film of the sample (10). The heating light of the repeating pulse output from the heating laser (22) is applied to the sample thin film via the light-shielding body (11). The continuous temperature measurement light output from the temperature measurement laser (23) is irradiated to a measurement position separated from the heating light irradiation position on the sample thin film by a predetermined distance. The photodetector (26) detects the reflected light of the temperature-measured light on the sample thin film, and the computer (28) acquires the thermoreflectance signal digitally converted by the AD converter (27). The computer (28) calculates the thermophysical property value in the creepage direction of the sample thin film of the sample (10) based on the acquired thermoreflectance signal.
机译:在热物理特征值测量装置(1)中,提供遮光体(11),其屏蔽除了开口之外的光之外的光,以面向样品(10)的样品薄膜的表面。从加热激光器(22)输出的重复脉冲的加热光通过遮光体(11)施加到样品薄膜。从温度测量激光器(23)输出的连续温度测量光被照射到与样品薄膜上的加热光照射位置分离的测量位置预定距离。光电探测器(26)检测样品薄膜上的温度测量光的反射光,并且计算机(28)获取由AD转换器(27)以数字转换的热反射信号。计算机(28)基于所获得的热射频信号计算样品薄膜的爬电方向的热神经性质值。

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