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METHOD FOR DETERMINING A BIAS AFFECTING PIXELS OF A PIXELATED DETECTOR OF IONIZING RADIATION
METHOD FOR DETERMINING A BIAS AFFECTING PIXELS OF A PIXELATED DETECTOR OF IONIZING RADIATION
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机译:用于确定电离辐射的像素化检测器的像素的偏置的方法
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摘要
A method for determining a bias (βi,j) affecting at least one pixel of a detector (1) of ionizing radiation, the detector comprising a plurality of pixels (10i,j), each pixel being configured to collect charge carriers (6) generated by an interaction of the ionizing radiation in the detector, and to form a pulsed signal under the effect of the generation and collection of the charge carriers, the pixels being distributed in a matrix array, the method comprising:a) following the occurrence of an interaction in the detector, determining a pixel forming a pulse that exceeds an amplitude threshold, during a detection time interval;b) among each pixel determined in step a), selecting a pixel of interest that generates a highest amplitude;c) selecting at least one distant pixel (10f), the position of the distant pixel, with respect to the pixel of interest, being defined beforehand;d) measuring an amplitude of a signal generated by each distant pixel;e) on the basis of each measurement performed in step d), determining a bias at the detection time for each distant pixel.展开▼