METHOD OF DETERMINING AT LEAST ONE TOLERANCE BAND LIMIT VALUE FOR A TECHNICAL VARIABLE UNDER TEST AND CORRESPONDING CALCULATION DEVICE

摘要

Disclosed is a method of determining at least one tolerance band limit value (k, k_p, k_c) for a technical variable (x) under test, comprising: - obtaining (S10, S10p, S10c, S20) the at least one tolerance band limit value (k, k_p, k_c) from sample tolerance band limit values of different samples, wherein the samples comprise values (z) of the technical variable (x) under test of the associated sample, wherein obtaining the at least one tolerance band limit value (k, k_p, k_c) comprises using a location measure (mean k, mean k_p, mean k_c) of a distribution according to which the sample tolerance band limit values (k, k_p, k_c) are distributed, wherein the technical variable (x) under test is distributed according to an underlying extreme value distribution function (F0, F9, F10), wherein each of the sample tolerance band limit values (k, k_p, k_c) is calculable or is calculated (S6, S6p, S6c) using a sample-specific conditional probability distribution function (F4, F11) which is a function of sample values (z) of the sample, and wherein the technical variable (x) relates to a physical characteristic of a product that is producible in an industrial mass production process.